Mark M. Tehranipoor, PhD, IEEE Fellow, ACM Fellow

Intel Charles E. Young Preeminence Endowed Chair Professor in Cybersecurity, ECE Department, University of Florida

Co-founder, IEEE Int. Symposium on Hardware-Oriented Security and Trust (HOST), IEEE AsianHOST, AND IEEE PAINE

Program Director of Cybersecurity in the Herbert Wertheim College of Engineering

Director, Florida Institute for Cybersecurity (FICS) Research, AND Edaptive Computing Inc. Transition Center (ECI-TC)

Co-director, AFOSR/AFRL Center of Excellence on Enabling Cyber Defense in Analog and Mixed Signal Domain (CYAN)

Co-director, National Microelectronic Security Training Center (MEST)

Professional Activities

Chair Positions:

  • Vice-Program Chair, IEEE International Worshop on Silicon Lifecycle Management (SLM), 2021
  • Co-general Chair, IEEE International Symposium on Hardware-Oriented Security and trust (HOST), 2021
  • General Chair, IEEE International Conference on Physical Assurance and Inspection of Electronics (PAINE), 2019-2021
  • Program Chair, International Test Conference (ITC), 2019
  • Vice-program Chair, International Test Conference (ITC), 2018
  • Co-program Chair, IEEE International Verification and Security Workshop (IVSW), 2016
  • Co-program Chair, IEEE International Workshop on Cross-Layer Cyber-Physical Systems Security (CPSS), 2016
  • Program Chair, ARO/CHASE Special Workshop on Counterfeit Electronics, University of Connecticut, January 2013
  • Program Chair, ARO Special Workshop on Hardware Assurance, Washington DC, April 2011
  • Program Chair, ARO Special Workshop on Hardware Assurance, University of Connecticut, August 2009
  • General Chair, IEEE Workshop on Defect and Data Driven Testing (D3T), 2009
  • General Chair, International Symposium on Defect and Fault Tolerance of VLSI Systems (DFT), 2009
  • General Chair, IEEE International Workshop on Hardware-Oriented Security and Trust (HOST), 2009
  • Program Chair, IEEE Workshop on Defect and Data Driven Testing (D3T), 2008, Santa Clara, CA
  • Chair, Steering Committee, IEEE International Workshop on Hardware-Oriented Security and Trust (HOST), 2008-present
  • General Chair, 1st IEEE International Workshop on Hardware-Oriented Security and Trust (HOST), 2008
  • Program Chair, IEEE Workshop on Defect Based Testing (DBT), 2007, Santa Clara, CA
  • Vice-General Chair, IEEE North Atlantic Test Workshop (NATW), 2011
  • Co-Program Chair, International Symposium on Defect and Fault Tolerance of VLSI Systems (DFT), 2008, Boston,MA
  • Local Arrangement Chair, IEEE Int. Symp. on Defect and Fault Tolerance in VLSI Systems (DFT), 2006
  • Member, Steering Committee, IEEE International Verification and Security Workshop (IVSW), 2016-present
  • Member, Steering Committee, IEEE Workshop on Defect and Data Driven Testing (D3T), 2009-2010
  • Member, Steering Committee, IEEE Workshop on Defect and Adaptive Test Analysis (DATA), 2011-present
  • Security Special Session Track Chair, IEEE International Microprocessor Test and Verification (MTV), 2016
  • Co-program Chair, Internet of Things (IoT) and Automotive Security Workshop (IASW), co-located with HOST Symposium, 2017-present
  • Industry Liaison, Workshop for Women in Hardware and Systems Security (WISE), 2017-present
  • Industry Liaison, IEEE Asian Symposium on Hardware-Oriented Security and Trust (AsianHOST), 2016
  • Panel Chair, IEEE Asian Symposium on Hardware-Oriented Security and Trust (AsianHOST), 2017

Founding Positions:

  • Co-founder, IEEE International Physical Attacks and Inspection on Electronics (PAINE) Conference
  • Co-founder, International IEEE Verification and Security Workshop (IVSW)
  • Co-founder, Trusted and Assured Microelectronics (TAME) Forum
  • Co-founder, IEEE Asian Symposium on Hardware-Oriented Security and Trust (Asian HOST)
  • Co-founder, Journal of Hardware and Systems Security (HASS), 2016-present
  • Director & Founder, Florida Institute for Cybersecurity (FICS), 2015-present
  • Founder and Director, Center for Hardware Assurance, Security, and Engineering (CHASE), 2012-2015
  • Founder and Director, Comcast Center of Excellenxe in Security Innovation (CSI), 2013-2015
  • Co-founder,, IEEE International Symposium on Hardware-Oriented Security and Trust (HOST), 2008
  • Co-founder,, Trust-Hub, 2010

Editorial Boards:

  • Editor-in-Chief (EIC), Journal of Hardware and Systems Security (HASS), 2016-present
  • Associate Editor-in-Chief (EIC), IEEE Design & Test, 2012-2014
  • Associate Editor, IEEE Transactions on Computers, 2019-present
  • Associate Editor, ACM Transactions on Design Automation of Electronic Systems (TODAES), 2013-2020
  • Associate Editor, IEEE Design & Test of Computers, 2009-2017
  • Associate Editor, Journal of Low Power Electronics (JOLPE), 2010-present
  • Associate Editor, Journal of Electronic Testing: Theory and Applications (JETTA), 2007-present
  • Editor, TTTC Newsletter, 2008-2010
  • Guest Editor, Special issue on CAD for Security: Pre-silicon Security Sign-off Solutions Through Design Cycle, ACM Journal on Emerging Technologies in Computing Systems (JETC), 2022, F. Farahmandi, A. Srivastava, G. Di Natale, and M. Tehranipoor
  • Guest Editor, IEEE Transactions on Dependable and Secure Computing (TDSC), Special Issue on “Emerging Attacks and Solutions for Secure Hardware in the Internet of Things”, Guest Editors: Chip Hong Chang, Marten van Dijk, and U. Ruhrmair, 2017
  • Guest Editor, IEEE Transactions on Multi-Scale Computing Systems, Special Issue on “Hardware and Software Cross-Layer Technologies for Trustworthy and Secure Computing”, Guest Editors: Shiyan Hu (Michigan Technological University), Yier Jin (University of Central Florida), Mark M. Tehranipoor (University of Connecticut), Kenneth Heffner (Honeywell), 2015
  • Guest Editor, IEEE Design & Test Special Issue on “On-Chip Structures for Smarter Silicon”, Guest Editors: Mohammad Tehranipoor (UConn) and LeRoy Winemberg (Freescale Semiconductor), 2012
  • Guest Editor, IEEE Computer Society Computing Now Special Issue on “Hardware Security and Trust”, Guest Editors: Mohammad Tehranipoor (UConn) and Farinaz Koushanfar (Rice University), 2010
  • Guest Editor, IEEE Design & Test Special Issue on “Verifying Physical Trustworthiness of Integrated Circuits and Systems”, Guest Editors: Mohammad Tehranipoor (UConn) and Farinaz Koushanfar (Rice University), 2009
  • Guest Editor , Special issue on “Test, Defect Tolerance, and Reliability of Nanoscale Devices”, Journal of Electronic Testing: Theory and Applications (JETTA), 2007
  • Guest Editor , Special issue on “IR-Drop and power Supply Noise Effects on Design and Tetst of Very Deep Submicron Designs”, IEEE Design & Test of Computers, Guest Co-editor: Ken Butler (Texas Instruments), 2007

Non-IEEE/ACM Events Position:

  • Member, Scientific Advisory Board, Center for Advanced Studies, LMU Munich
  • Chair, Advisory Board, SECURE Center. Prairie View A&M University (PVAMU)
  • Florida State University System (SUS) Cybersecurity Steering Group (Governing Council), 2020-present
  • Co-Chair, Trusted and Assured Microelectronics (TAME) Forum, Nov. 2017
  • Steering Committee, Trusted and Assured Microelectronics (TAME) Forum
  • Chair, FICS Annual Conference on Cybersecurity, March 2017. 13 companies sponsored this event. 210 attended.
  • Chair, FICS Annual Conference on Cybersecurity, February 2016. 12 companies sponsored this event. 155 attended.
  • Chair, CHASE Conference on Secure/Trustworthy Systems and Supply Chain Assurance, 2015. 10 companies sponsored this event.
  • Co-organizer, CyberSEED, More than a dozen companies sponsored this event. 2014
  • Chair, CHASE Workshop on Secure/Trustworthy Systems and Supply Chain Assurance, 2014
  • Chair, ARO/CHASE Sponsored Workshop on Counterfeit Electronics, 2013
  • Chair, 2nd ARO Sponsored Workshop on Hardware Assurance, 2011
  • Chair, 1st ARO Workshop on Hardware Assurance, 2009

Session Organizer:

  • Special Session, Emerging Topics in Security and Trust I, International Test Conference (ITC), 2017 (Speakers: (Domenic Forte (University of Florida), Jeyavijayan Rajendran (Texas A&M University), and Krishnendu Chakrabarty (Duke University))
  • Special Session, Emerging Topics in Security and Trust II, International Test Conference (ITC), 2017 (Speakers: Brian Dupaix (AFRL), Patrick Schaumont (Vriginia Tech), and An Chen (Semiconductor Research Corporation)
  • Special Session, Physical Attacks: Can Test Save Us?, IEEE VLSI Test Symposium (VTS), 2017
  • Special Session 1, IP Protection, IEEE Microprocessor Test and Verification (MTV), 2016
  • Special Session 2, Test for Security and Trust, IEEE Microprocessor Test and Verification (MTV), 2016
  • Special Session, Test for Security and Trust of Integrated Circuits, International Test Conference (ITC), 2016
  • Special Session, Security Validation in IOT Space, IEEE VLSI Test Symposium (VTS), April 2016
  • Special Session, Electronic Supply Chain Security, IEEE VLSI Design, India, Jan 2016
  • Special Session, New Directions in Hardware Security, IEEE Microprocessor Test Workshop, Austin, 2015, With Domenic Forte (University of Florida)
  • HOT Topic Session on Counterfeit Electronics, IEEE VLSI Test Symposium (VTS), May 2013 (with Ilia Polian, University of Passau)
  • Smart Silicon, IEEE VLSI Test Symposium (VTS), May 2011 (with LeRoy Windemberg, Freescale Semiconductor)
  • Moderator, Roundtable on Hardware Security and Trust, IEEE Design & Test Magazine, September/October 2011

Professional Memberships:

  • Fellow, ACM
  • Fellow, IEEE
  • Golden Core Member, IEEE
  • Member, ACM SIGDA
  • Member, TTTC
  • Member, TTTC Middle East and Africa Group
  • Connecticut Academy of Science and Engineering (CASE)

Program Committee Memberships:

  • Research in Attacks, Intrusions and Defenses (RAID)
  • IEEE Microprocessor Test and Verification (MTV)
  • Smart City Security and Privacy (SCSP)
  • Design Automation Conference (DAC)
  • International Test Conference (ITC)-Asia
  • Design Automation Conference (DAC) Panel Committee
  • IEEE CS Annual Symposium on VLSI (ISVLSI)
  • IEEE Conference on Very Large Scale Integration
  • International Test Conference (ITC)
  • CSI International Symposium on Computer Architecture & Digital Systems (CADS)
  • Design, Automation, and Test in Europe (DATE)
  • IEEE Asian Test Symposium (ATS)
  • European Test Symposium (ETS)
  • IEEE VLSI Test Symposium (VTS)
  • ACM SIGDA Ph.D. DAC Forum
  • International Conference on Nano-Networks (Nano-Net)
  • IEEE Workshop on RTL and High Level Testing (WRTLT)
  • ACM Great Lake Symposium on VLSI (GLSVLSI)
  • International Conference on Communication Theory, Reliability, and Quality of Service (CTRQ)
  • IEEE Int. Workshop on Defect Based Testing (DBT)
  • IEEE Int. Workshop on Data and Defect Drive Test (D3T)
  • IEEE Int. Defect and Adaptive Test Analysis (DATA)
  • Int. Conference on Computer Design (ICCD)
  • North Atlantic Test Workshop (NATW)
  • IEEE Int. Symp. on Defect and Fault Tolerance in VLSI Systems (DFT )
  • IEEE International Design and Test Workshop (IDT)
  • International Symposium on Nanoscale Architectures (NanoArch)
  • IEEE Int. On-Line Testing Symposium (IOLTS)
  • Int. Workshop on Impact of Low-Power Design on Test and Reliability
  • Workshop on Unique Chips and Systems (UCAS)
  • IEEE Workshop on Design for Reliability and Variability (DRV)

Session Chair:

  • Int. Workshop on Current and Defect-Based Testing (DBT)
  • IEEE North Atlantic Test Workshop (NATW)
  • International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT)
  • Design Automation Conference (DAC)
  • International Symposium on Nanoscale Architectures (NanoArch)
  • International Test Conference (ITC)
  • IEEE Workshop on RTL and High Level Testing (WRTLT)
  • IEEE VLSI Test Symposium (VTS)
  • International Test Conference (ITC)

Selected Review Activities:

  • National Science Foundation (NSF)
  • IEEE Transactions on Computer-Aided Design of of Integrated Circuits and Systems
  • IEEE Transactions on Very Large Scale Integration Systems
  • IEEE Transactions on Computers
  • ACM Transactions on Design Automation of Electronic Systems (TODAES)
  • Journal of Electronic Testing: Theory and Applications (JETTA)
  • ACM Journal on Emerging Technologies in Computing Systems (JETC)
  • Design, Automation, and Test in Europe (DATE)
  • IEEE Conference on VLSI
  • IEEE Workshop on RTL Test (ARTLT)
  • International Test Conference (ITC)
  • Great Lake Symposium on VLSI (GLSVLSI)
  • IBM Journal of Research and Development
  • IEEE North Atlantic Test Workshop (NATW)
  • IEEE Communication Magazine
  • IEEE VLSI Test Symposium (VTS)
  • International Conference on Microelectronics (ICM)
  • International Journal of Computers and Applications
  • IEEE Asian Test Symposium (ATS)
  • Design Automation Conference (DAC)