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Mark M. Tehranipoor, PhD

Intel Charles E. Young Preeminence Endowed Chair Professor in Cybersecurity

Associate Chair for Research and Strategic Initiatives

ECE Department, University of Florida

Co-founder, International Symposium on Hardware-Oriented Security and Trust (HOST)

Co-director, Florida Institute for Cybersecurity Research (FICS)

Email: lastname at ufl dot edu

Publications

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 Books

  1. M. Tehranipoor, D. Forte, G, Rose, and S. Bhunia, Security Opportunities in Nano Devices and Emerging Technologies, CRC Press, 2017.
  2. S. Bhunia and M. Tehranipoor, The Hardware Trojan War: Attacks, Myths, and Defenses, Springer, 2017.
  3. D. Forte, S. Bhunia, and M. Tehranipoor, Hardware Protection through Obfuscation, Springer, 2017.
  4. P. Mishra, S. Bhunia, and M. Tehranipoor, Hardware IP Security and Trust, Springer, 2017.
  5. M. Tehranipoor, U. Guin, and D. Forte, Counterfeit Integrated Circuits: Detection and Avoidance, Springer, 2015.
  6. M. Tehranipoor, H. Salmani, and X. Zhang, Integrated Circuit Authentication: Hardware Trojans and Counterfeit Detection, Springer, July 2013.
  7. M. Tehranipoor and C. Wang, Introduction to Hardware Security and Trust, Springer, August 2011.
  8. M. Tehranipoor, K. Peng, and K. Chakrabarty, Test and Diagnosis for Small-Delay Defects, Springer, September 2011.
  9. M. Tehranipoor,  Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability, Springer, November, 2007.
  10. M. Tehranipoor and N. Ahmed, Nanometer Technology Designs: High-Quality Delay Tests, Springer, December 2007.

Book Chapters

  1. F. Rahman, A. Prasad Deb Nath, D. Forte, S. Bhunia, and M. Tehranipoor,  "Nano CMOS Logic-Based Security Primitive," in Security Opportunities in Nano Devices and Emerging Technologies, CRC Press, 2017.
  2. H. Shen, F. Rahman, M. Tehranipoor, and D. Forte,  "Carbon-Based Novel Devices for Hardware Security," in Security Opportunities in Nano Devices and Emerging Technologies, CRC Press, 2017.
  3. F. Rahman, A. Prasad Deb Nath, S. Bhunia, D. Forte, and M. Tehranipoor,  "Composition of Physical Unclonable Functions: From Device to Architecture," in Security Opportunities in Nano Devices and Emerging Technologies, CRC Press, 2017.
  4. B. Shakya, X. Xu, N. Asadi, M. Tehranipoor, and D. Forte,  "Leveraging Circuit Edit for Low-Volume Trusted Nanometer Fabrication," in Security Opportunities in Nano Devices and Emerging Technologies, CRC Press, 2017.
  5. U. Guin and M. Tehranipoor, and F. Forte,  "Obfuscation and Encryption for Securing Semiconductor Supply Chain," in Hardware Protection through Obfuscation, 2016.
  6. Q. Shi, K. Xiao, D. Forte, and M. Tehranipoor,  "Obfuscated Built-in Self Authentication," in Hardware Protection through Obfuscation, 2016.
  7. T. Rahman, D. Forte, M. Tehranipoor,  "Protection of Assets from Scan Chain Vulnerabilities through Obfuscation," in Hardware Protection through Obfuscation, 2016.
  8. Z. Guo, M. Tehranipoor, and F. Forte,  "Permutation based Obfuscation," in Hardware Protection through Obfuscation, 2016.
  9. B. Shakya, M. Tehranipoor, S. Bhunia, and F. Forte,  "Introduction to Hardware Obfuscation: Motivation, Methods and Evaluation," in Hardware Protection through Obfuscation, 2016.
  10. Q. Shi, D. Forte and M. Tehranipoor,  "Analyzing Circuit Layout to Probing Attack," in Hardware IP Security and Trust: Validation and Test, 2016.
  11. A. Nahiyan and M. Tehranipoor,  "Code Coverage Analysis for IP Trust Verification," in Hardware IP Security and Trust: Validation and Test, 2016.
  12. H. Salmani and M. Tehranipoor,  "Digital Circuits Vulnerability to Hardware Trojans," in Hardware IP Security and Trust: Validation and Test, 2016.
  13. A. Nahiyan, K. Xiao, D. Forte, and M. Tehranipoor,  "Security Rule Check," in Hardware IP Security and Trust: Validation and Test, 2016.
  14. P. Mishra, S. Bhunia, and M. Tehranipoor,  "Security and Trust Vulnerabilities in Third-Party IPs," in Hardware IP Security and Trust: Validation and Test, 2016.
  15. P. Mishra, S. Bhunia, and M. Tehranipoor,  "The Future of Trustworthy Design," in Hardware IP Security and Trust: Validation and Test, 2016.
  16. K. Xiao, D. Forte, and M. Tehranipoor,  "Circuit Timing Signature (CTS) for Detection of Counterfeit Integrated Circuits," in Secure System Design and Trustable Computing, by Chip Hong Chang and Miodrag Potkonjak, 2015.
  17. N. Tuzzio and M. Tehranipoor, "RSA: Implementation And Security," in Introduction to Hardware Security and Trust, Springer, August 2011.
  18. M. Tehranipoor and J. Lee, "Protecting IPs Against Scan-Based Side-Channel Attacks," in Introduction to Hardware Security and Trust, Springer, August 2011.
  19. J. Ma and M. Tehranipoor, "Introduction to VLSI Testing," in Introduction to Hardware Security and Trust, Springer, August 2011.
  20. M. Tehranipoor, "Built-In Self-Test and Defect Tolerance for Molecular Electronics-Based NanoFabrics", in Robust Nano-Computing by Chao Huang, Springer 2010.
  21. M. Tehranipoor and B. Sunar, "Hardware Trojan Horses", in Towards Hardware Intrinsic Security: Foundation and Practice, by Ahmad R. Sadeghi, Springer, 2010.
  22. M. Tehranipoor and N. Ahmed, "Faster-than-at-speed Test for Screening SDDs," in Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits by Sandeep Goel and Krish Chakrabarty, Springer, 2010.
  23. K. Peng, M. Yilmaz, and M. Tehranipoor, "Circuit Path-Grading Considering Layout, Process Variations, and Crosstalk," in Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits by Sandeep Goel and Kr/private/var/folders/db/9m3dyzl957bb4tfnb8vftrkm0000gn/T/bc09a5d3-26b7-4999-b7a9-9c9d75a9c280/home/users/tehranipoor/htdocs/publications.htmlish Chakrabarty, Springer, 2010.
  24. M. Kassab amd M. Tehranipoor, "Test for Power Management Structures," in Power Aware Testing and Test Strategies for Low Power Devices, by P. Girard, N. Nicolici, and X. Wen, Springer, 2009.
  25. M. Tehranipoor,  "Test and Defect Tolerance for Nanoscale Crossbar-based Circuits," in System on Chip Test Architectures: Nanometer Design for Testability, by L.T. Wang, Charles Stroud and Nur Touba, Elsevier, Target Publication Date: Oct. 2007.
  26. M. Tehranipoor and R. Rad, "Defect Tolerance for Reconfigurable Nanoscale Architectures," in Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability, by Mohammad Tehranipoor, Springer, 2007.

Patents

  1. M. Tehranipoor, X. Wang, X. Zhang, "Embedded ring oscillator network for integrated circuit security and threat detection," 2014, , US 8850608 B2, WO 2012122309 A3 .
  2. M. Tehranipoor and N. Tuzzio, "Methods and Systems for Hardware Piracy Prevention," 2014, US 9071428 B2.
  3. M. Tehranipoor and K. Xiao, "Methods and systems for preventing hardware trojan insertion," 2015, US 9218506.

Guest Editorials

  1. S. Bhunia and M. Tehranipoor, "First Ever Issue of HaSS Journal," Editorial, Journal of Hardware and Systems Security (HaSS), March 2017.
  2. S. Hu, Y. Jin, K. Heffner, and M. Tehranipoor, "Hardware/Software Cross-Layer Technologies for Trustworthy and Secure Computing," Guest Editorial, IEEE TMSCS, 2016.
  3. I. Polian and M. Tehranipoor, "Special Issue on Hardware Security," Guest Editorial, IET Computers and Digital Techniques, 2015.
  4. M. Tehranipoor and F. Koushanfar, "Hardware Security and Trust," Guest Editorial, IEEE Computer Society Computing Now, September 2010.
  5.  M. Tehranipoor and F. Koushanfar, "Confronting the Hardware Trustworthiness Problem," Guest Editorial, IEEE Design and Test of Computers, Jan 2010.
  6. M. Tehranipoor and K. Butler, "IR-Drop and Power Supply Noise Effects on Design and Test of Very Deep Submicron Designs," Guest Editorial, IEEE Design and Test of Computers, July 2007.
  7. M. Tehranipoor, "Test, Defect Tolerance and Reliability of Nanoscale Devices," Guest Editorial, Journal of Electronic Testing: Theory and Applications (JETTA), Vol. 23, No. 2/3, pp. 115-116, June 2007.

Journal Papers

  1. X. Wang, D. Zhang, M. He, and M. Tehranipoor, "Secure Scan and Test Using Obfuscation Throughout Supply Chain," IEEE Trans. On Computer-Aided Design (TCAD), 2017.
  2. E. Principe, N. Asadi, D. Forte, R. Chivas, M. DiBattista, and S. Silverman, "Plasma FIB Deprocessing of Integrated Circuits from the Backside," Electronic Device Failure Analysis (EDFA), 2017.
  3. K. Yang, H. Shen, D. Forte, S. Bhunia, and M. Tehranipoor, "Hardware-Enabled Pharmaceutical Supply Chain Security," ACM Transactions on Design Automation of Electronic Systems (TODAES), 2017.
  4. T. Rahman, A. Hosey, J. Carrol, D. Forte, and M. Tehranipoor, "Systematic Correlation and Cell Neighborhood Analysis of SRAM-PUF for Robust and Unique Key Generation," Journal of Hardware and Systems Security (HaSS), 2017.
  5. F. Rahman, B. Shakya, X. Xu, D. Forte, and M. Tehranipoor, "Security Beyond CMOS: Fundamentals, Applications, and Roadmap," IEEE Transactions on VLSI (TVLSI), 2017.
  6. M. Sadi, G. Contreras, J. Chen, L. Winemberg, and M. Tehranipoor, "Design of Reliable SoCs with BIST Hardware and Machine Learning," IEEE Transactions on VLSI (TVLSI), 2017.
  7. H. Shen, F. Rahman, B. Shakya, X. Xu, M. Tehranipoor, and D. Forte, "Poly-Si Based Physical Unclonable Functions," IEEE Transactions on VLSI (TVLSI), 2017.
  8. H. Wang, Q. Shi, D. Forte, M. Tehranipoor, "Probing Attacks on Integrated Circuits: Challenges and Research Opportunities," IEEE Design & Test of Computers, 2017.
  9. M. He and M. Tehranipoor, "An Access Mechanism for Embedded Sensors in Modern SoCs," Journal of Electronics Testing: Theory and Applications (JETTA), 2017.
  10. S. Ray, S. Bhunia, and M. Tehranipoor, "System-on-Chip Security: Design and Validation," Proceedings of IEEE, 2017.
  11. T. He, G. Contreras, D. Tran, L. Winemberg, and M. Tehranipoor, "Test-Point Insertion Efficiency Analysis for LBIST in High-Assurance Applications," IEEE Transactions on VLSI (TVLSI), 2017.
  12. M. Tehranipoor, U. Guin, and S. Bhunia, "Invasion of the Hardware Snatchers: Fake Hardware Could Open the Door to Malicious Malware and Critical Failure," IEEE Spectrum, 2017.
  13. B. Shakya, H. Salmani, D. Forte, S. Bhunia, and M. Tehranipoor, "Benchmarking of Hardware Trojans and Maliciously Affected Circuits," Journal of Hardware and Systems Security (HaSS), 2017.
  14. M. Alam, N. Asadi, M. Tehranipoor, and D. Forte, "Impact of X-ray Tomography on the Reliability of Integrated Circuits," IEEE Transaction on Device and Materials Reliability, 2017.
  15. Z. Guo, J. Di, M. Tehranipoor, and D. Forte, "Obfuscation based Protection Framework Against Printed Circuit Boards Piracy Violations," ACM Transactions on Design Automation of Electronic Systems (TODAES), 2017.
  16. N. Asadi, M. Tehranipoor, and D. Forte, "PCB Reverse Engineering Using Non-destructive X-ray Tomography and Advanced Image Processing," IEEE Transactions on Components, Packaging and Manufacturing Technology (TCPMT), 2017.
  17. U. Guin, S. Bhunia, D. Forte, and M. Tehranipoor, "SMA: A System-Level Mutual Authentication for Protecting Electronic Hardware and Firmware," IEEE Transactions on Dependable and Secure Computing (TDSC), 2016.
  18. K. Yang, D. Forte, and M. Tehranipoor, "CDTA: A Comprehensive Solution for Counterfeit Detection, Traceability and Authentication in IoT Supply Chain," ACM Transactions on Design Automation of Electronic Systems (TODAES), 2016.
  19. N. Karimian, Z. Guo, M. Tehranipoor, and D. Forte, "Highly Reliable Key Generation from Electrocardiogram (ECG)," IEEE Transactions on Biomedical Engineering (TBME), 2016.
  20. X. Wang, P. Jiao, M. Sadi, L. Winemberg, and M. Tehranipoor, "TRO: An On-chip Ring Oscillator Based GHz Transient IR-Drop Monitor," IEEE Trans. On Computer-Aided Design (TCAD), 2016.
  21. M. Sadi, L. Winemberg, S. Kannan, and M. Tehranipoor, "SoC Speed Binning Using Machine Learning and On-chip Slack Sensors," IEEE Trans. On Computer-Aided Design (TCAD), 2016.
  22. K. Xiao, Nahiyan, and M. Tehranipoor, " Security Rule Checking in IC Design," IEEE Computer Magazine, 2016.
  23. J. Wurm, Y. Jin, Y. Liu, S. Hu, K. Heffner, F. Rahman, and M. Tehranipoor, "Introduction to Cyber Physical System Security: A Cross-Layer Perspective," IEEE Trans. On Multi-Scale Computing Systems (TMSCS), 2016.
  24. Y. Xie, C. Bao, C. Serafy, T. Lu, A. Srivastava, and M. Tehranipoor, "Security and Vulnerability Implications of 3D ICs," IEEE Trans. On Multi-Scale Computing Systems (TMSCS), 2016.
  25. K. Xiao, D. Forte, Y. Jin, R. Karri, S. Bhunia, and M. Tehranipoor, "Hardware Trojans: Lessons Learned After One Decade of Research," ACM Transactions on Design Automation of Electronic Systems (TODAES), 2016.
  26. U. Guin, Q. Shi, D. Forte, and M. Tehranipoor, "FORTIS: A Comprehensive Solution for Establishing Forward Trust for Protecting IPs and ICs," ACM Transactions on Design Automation of Electronic Systems (TODAES), 2016.
  27. Q. Shi, X. Wang, L. Winemberg, and M. Tehranipoor, "On-Chip Sensor Selection for Effective Speed-Binning," Int. Journal on Analog Integrated Circuits and Signal Processing, 2016.
  28. H. Salmani and M. Tehranipoor, "Vulnerability Analysis of a Circuit Layout to Hardware Trojan Insertion," IEEE Transactions on Information Forensics & Security (TIFS), 2016.
  29. M. Sadi and M. Tehranipoor, "Design of a Network of Digital Sensor macros for Extracting Power Supply Noise Profile in SoCs," IEEE Transactions on VLSI (TVLSI), 2016.
  30. X. Wang, D. Zhang, D. Su, L. Winemberg, and M. Tehranipoor, "A Novel Peak Power Supply Noise Measurement and Adaptation System for Integrated Circuits," IEEE Transactions on VLSI (TVLSI), 2016.
  31. T. Rahman, F. Rahman, D. Forte, and M. Tehranipoor, "An Aging-Resistant RO-PUF for Reliable Key Generation," IIEEE Transactions on Emerging Topics in Computing (TETC), 2015.
  32. U. Guin, D. Forte, and M. Tehranipoor, "Design of Accurate Low-Cost On-Chip Structures for Protecting Integrated Circuits Against Recycling," IEEE Transactions on VLSI (TVLSI), 2015.
  33. S. Quadir, J. Chen, D. Forte, N. Asadi, S. Shahbaz, L. Wang, J. Chandy, and M. Tehranipoor, "A Survey on Chip to System Reverse Engineering," ACM Journal on Emerging Technologies in Computing Systems (JETC), 2015.
  34. S. Kelly, X. Zhang, M. Tehranipoor, and A. Ferraiuolo, "Detecting Hardware Trojans using On-chip Sensors in an ASIC Design," Journal of Electronic Testing: Theory and Applications (JETTA), 2015.
  35. X. Wang, D. Tran, S. George, L. Winemberg, N. Ahmed, S. Palosh, L. Dobia, M. Tehranipoor, "Aging Adaption in Integrated Circuits Using a Novel Built-In Sensor," IEEE Transactions on CAD (TCAD), 2015.
  36. K. Xiao, D. Forte, and M. Tehranipoor, "A Novel Built-In Self-Authentication Technique to Prevent Inserting Hardware Trojans," IEEE Transactions on CAD (TCAD), 2014.
  37. A. Tomita, X. Wen, Y. Sato, S. Kajihara, K. Miyase, S. Holst, P. Girard, M. Tehranipoor, L.T. Wang, "On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST," IEICE Transactions, 2014.
  38. U. Guin, K. Huang, D. DiMase, J. Carulli, M. Tehranipoor, Y. Makris, "Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain," Proceedings of IEEE, 2014.
  39. Z. Collier, D. DiMase, S. Walters, M. Tehranipoor, J. Lambert, and I. Linkov, "Risk-Based Cybersecurity Standards: Policy Challenges and Opportunities," IEEE Computer Magazine, 2014.
  40. U. Guin, D. DiMase, and M. Tehranipoor, "A Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges Ahead," Journal of Electronic Testing: Theory and Applications (JETTA), 2014.(Most Downloaded Article in 2014)
  41. U. Guin, D. DiMase, and M. Tehranipoor, "A Comprehensive Framework for Counterfeit Defect Coverage Analysis and Detection Assessment," Journal of Electronic Testing: Theory and Applications (JETTA), 2014.
  42. A. Markman, B. Javidi, and M. Tehranipoor, "Photon-Counting Security Tagging and Verification Using Optically Encoded QR Codes," IEEE Photonics Journal, 2013.
  43. X. Zhang and M. Tehranipoor, "Design of On-chip Light-weight Sensors for Effective Detection of Recycled ICs,," IEEE Transactions on VLSI (TVLSI), 2013.
  44. F. Bao, K. Peng, M. Tehranipoor, and K. Chakrabarty, "Generation of Effective 1-Detect TDF Patterns for Detecting Small-Delay Defects,," IEEE Trans. on CAD (TCAD), 2013.
  45. S. Wang and M. Tehranipoor, "A Light-Weight On-Chip Structure for Measuring Timing Uncertainty Induced by Noise in Integrated Circuits," IEEE Transactions on VLSI (TVLSI), 2013.
  46. W. Zhao, J. Ma, M. Tehranipoor, and S. Chakravarty, "Power-Safe Application of TDF Patterns to Flip-Chip Designs during Wafer Test," ACM Transactions on Design Automation of Electronic Systems (TODAES), 2013.
  47. M. Li, A. Davoodi, and M. Tehranipoor, "A Sensor-Assisted Self-Authentication Framework for Hardware Trojan Detection," IEEE Design & Test, 2013.
  48. K. Xiao, X. Zhang, and M. Tehranipoor, "A Clock Sweeping Technique for Detecting Hardware Trojans Impacting Circuits Delay," IEEE Design & Test, 2013.
  49. F. Bao, K. Peng, M. Yilmaz, K. Chakrabarty, L. Winemberg, and M. Tehranipoor, "Efficient Pattern Generation for Small-Delay Defects Using Selection of Critical Faults," Journal of Electronic Testing: Theory and Applications (JETTA), 2013.
  50. J. Chen, S. Wang, and M. Tehranipoor, "Critical-Reliability Path Identification and Delay Analysis," ACM Journal on Emerging Technologies in Computing Systems (JETC), 2013.
  51. X. Zhang, A. Ferraiuolo, and M. Tehranipoor, "Detection of Hardware Trojans using a Combined Ring Oscillator Network and Off-chip Transient-Power Analysis," ACM Journal on Emerging Technologies in Computing Systems (JETC), 2013
  52. J. Villasenor and M. Tehranipoor, " The Hidden Dangers of Chop-Shop Electronics," IEEE Spectrum, October 2013.
  53. K. Peng, M. Yilmaz, K. Chakrabarty, and M. Tehranipoor, "Crosstalk- and Process Variations-Aware High-Quality Tests for Small-Delay Defects,"IEEE Transactions on VLSI (TVLSI), 2012.
  54. M. Abramovici, et. al., "Protecting Against Hardware Trojan Attacks: Towards a Comprehensive Solution," IEEE Design & Test of Computers, 2012.
  55. W. Zhao, M. Tehranipoor, and S. Chakravarty, "Ensuring Power-Safe Application of Test Patterns Using An Effective Gating Approach Considering Current Limits," Journal of Low Power Electronics (JOLPE), 2012.
  56. X. Wang, M. Tehranipoor, S. George, D. Tran and L. Winemberg, "Design and Analysis of a Delay Sensor Applicable to Process/Environmental Variations and Aging Measurement", IEEE Transactions on VLSI (TVLSI), 2012.
  57. H. Salmani, W. Zhao, M. Tehranipoor, S. Chakravarty, P. Girard, and X. Wen, "Layout-Aware Pattern Evaluation and Analysis for Power-Safe Application of TDF Patterns," Journal of Low Power Electronics (JOLPE), 2012.
  58. H. Salmani, M. Tehranipoor, and J. Plusquellic, "A Novel Technique for Improving Hardware Trojan Detection and Reducing Trojan Activation Time," IEEE Transactions on VLSI (TVLSI), 2012.
  59. H. Salmani and M. Tehranipoor, "A Layout-Aware Approach for Improving Localized Switching to Detect Hardware Trojans in Digital Integrated Circuits," Transactions on Information Forensics & Security (TIFS), 2012.
  60. J. Ma, M. Tehranipoor, and P. Girard, "A Layout-Aware Pattern Grading Procedure for Critical Paths Testing Considering Crosstalk and Power Supply Noise," Journal of Electronics Testing: Theory and Applications (JETTA), 2012.
  61. J. Ma and M. Tehranipoor, "Layout-Aware Critical Path Delay Test under Maximum Power Supply Noise Effects," IEEE Transactions on CAD (TCAD), 2011.
  62. C. Lamech, R. Rad, J. Plusquellic, and M. Tehranipoor, "An Experimental Analysis of Power and Delay Signal-to-Noise Requirements for Detecting Trojans and Methods for Achieving the Required Detection Sensitivities," IEEE Transactions on Information Forensics & Security (TIFS), 2011.
  63. M. Tehranipoor, H. Salmani, X. Zhang, X. Wang, R. Karri, J. Rajendran, and K. Rosenfeld, "Trustworthy Hardware: Trojan Detection Solutions and Design-for-Trust Challenges," IEEE Computer Magazine, 2011.
  64. M. Yilmaz, K. Chakrabarty, and M. Tehranipoor, "Adaptation and Evaluation of the Output-Deviations Metric to Target Small-Delay Defects in Industrial Circuits," IEEE Design and Test of Computers, 2010.
  65. R. Karri, J. Rajendran, K. Rosenfeld, and M. Tehranipoor, "Trustworthy Hardware: Identifying and Classifying Hardware Trojans," IEEE Computer Magazine, 2010.
  66. M. Tehranipoor and K. Butler, "Power Supply Noise: A Survey on Effects and Research," in IEEE Design and Test of Computers, 2010.
  67. F. Wu, L. Dilillo, A. Bosio, P. Girard, S. Pravossoudovitch, A. Virazel, M. Tehranipoor, X. Wen, and N. Ahmed, "A Comprehensive Analysis of Transition Fault Coverage and Test Power Dissipation for LOS and LOC Schemes," Journal of Low Power Electronics (JOLPE), 2010.
  68. M. Yilmaz, K. Chakrabarty, and M. Tehranipoor, "Test-Pattern Selection Small-Delay Defects in Very-Deep Submicron Integrated Circuits," IEEE Transactions on CAD, 2010.
  69. N. Ahmed and M. Tehranipoor, "A Novel IR-drop Tolerant Transition Delay Fault Test Pattern Generation Procedure," Journal of Low Power Electronics (JOLPE), 2010.
  70. M. Tehranipoor and F. Koushanfar, "A Survey of Hardware Trojan Taxonomy and Detection," IEEE Design and Test of Computers, 2010.
  71. N. Ahmed and M. Tehranipoor, "A Novel Faster-than-at-speed Transition Delay Test Method Considering IR-drop Effects," IEEE Trasactions on CAD, 2010.
  72. R. Rad, J. Plusquellic, and M. Tehranipoor, "A Sensitivity Analysis of Power Signal Methods for Detecting Hardware Trojans under Real Process and Environmental Conditions," IEEE. Transactions on VLSI (TVLSI), 2009
  73. K. Miyase, X. Wen, H. Furukawa, Y. Yamato, S. Kajihara, P. Girard, L.-T. Wang, and M. Tehranipoor, "High Launch Switching Activity Reduction in At- Speed Scan Testing using CTX: A Clock-Gating-Based  Test Relaxation and X-Filling Scheme," IEICE Trans. Fundamentals/Commun./Electron/Inf. & Syst., vol. E85-A/B/C/D, 2009.
  74. J. Lee and M. Tehranipoor, "Layout-Aware Transition-Delay Fault Pattern Generation with Evenly Distributed Switching Activity," Journal of Low Power Electronics (JOLPE), Vol. 4, No. 3, 2008.
  75. M. Tehranipoor and R. Rad, "Defect Tolerance for Nanoscale Crossbar-based Devices," in IEEE Design & Test of Computers, 2008.
  76. R. Rad and M. Tehranipoor, "SCT: A Novel Approach For Testing and Configuring Nanoscale Devices," in ACM Journal on Emerging Technologies in Computing Systems (JETC), 2008.
  77. M. Nourani, M. Tehranipoor and N. Ahmed,  "Low-Transition Test Pattern Generation for BIST-Based Applications," IEEE Transactions on Computers, vol. 57, no. 3, pp. 303-315, March 2008.
  78. J. Lee, M. Tehranipoor, C. Patel and J. Plusquellic, "Securing Designs Against Scan-Based Side-Channel Attacks," IEEE Transactions on Dependable and Secure Computing (TDSC), vol. 4, no. 4, Oct.-Dec. 2007. .
  79. R. Rad and M. Tehranipoor, "Evaluating Area and Performance of a Hybrid FPGA with Nanoscale Clusters and CMOS Routing," ACM Journal on Emerging Technologies in Computing Systems (JETC), vol. 3, no. 3, Nov. 2007.
  80. M. ElShoukry and M. Tehranipoor and C.P. Ravikumar, "A Critical-Path Aware Partial Gating Approach for Test Power Reduction," ACM Transactions on Design Automation of Electronic Systems (TODAES), Volume 12 ,  Issue 2, April 2007.
  81. N. Ahmed, M. Tehranipoor, C.P. Ravikumar and K. Butler, "Local At-Speed Scan Enable Generation for Transition Fault Testing Using Low-Cost Testers," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (CAD/ICAS), vol. 26, no. 5, pp. 896-906, May 2007.
  82. M. Tehranipoor and R. M.P. Rad, "Built-In Self-Test and Recovery Procedures for Molecular Electronics-Based NanoFabrics," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (CAD/ICAS), vol. 26, no. 5, 943-958, May 2007.
  83. N. Ahmed and M. Tehranipoor,  "Improving Quality of Transition Delay Test Using Hybrid Scan-Based Technique," IEEE Design and Test of Computers, 2006.
  84. D. Acharyya, A. Singh, M. Tehranipoor, C. Patel and J. Plusquellic, "Quiescent Signal Analysis: a Multiple Supply Pad IDDQ Method," IEEE Design and Test of Computers, vol. 23, no. 4, pp. 278-293, 2006.
  85. M. Tehranipoor, M. Nourani and K. Chakrabarty, "Nine-Coded Compression Technique for Testing Embedded Cores in SoCs,"  IEEE Transactions on Very Large Scale Integration Systems (TVLSI), vol. 13, no. 6, pp. 719-731, June 2005.
  86. M. Nourani and M. H. Tehranipour, "RL-Huffman Encoding for Test Compression and Power Reduction in Scan Application,"  ACM Transactions on Design Automation of Electronic Systems (TODAES), vol. 10, no. 1, pp. 91-115, Jan. 2005.
  87. M. H. Tehranipour, N. Ahmed and M. Nourani, "Testing SoC Interconnects for Signal Integrity Using Extended JTAG Architecture," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (CAD/ICAS), vol. 23, issue 5, pp. 800-811, May 2004.
  88. M. H. Tehranipour, S. M. Fakhraie, Z. Navabi and M. R. Movahedin, "A Low-Cost At-Speed BIST Architecture for Embedded Processor and SRAM Cores," Journal of Electronic Testing: Theory and Applications (JETTA), vol. 20, pp. 155-168, April 2004.
  89. M. H. Tehranipour, S. M. Fakhraie, M. Nourani, M. R. Movahedin and Z. Navabi, "Embedded Test for Processor and Memory Cores in System-on-Chips," International Journal of Science and Technology, vol. 10, no. 4, pp. 486-494, Oct. 2003.

Conference Papers

  1. X. Wang, L. Yu, F. Rahman, and M. Tehranipoor, "IV-PUF: Interconnect Variations PUF with Self-Masking Circuit for Performance Enhancement," IEEE Microprocessor Test and Security Conference (MTV), 2017.
  2. S. Choudhury, X. Xu, M. Tehranipoor, and D. Forte, "Aging-Resistant RO PUF with Increased Reliability in FPGA," Int. Conference on Reconfigurable Computing and FPGAs (Reconfig), 2017.
  3. A. Chhotaray, A. Nahiyan, T. Shrimpton, D. Forte, and Mark Tehranipoor, "Standardizing Bad Cryptographic Practice - A teardown of the IEEE standard for protecting electronic-design intellectual property," ACM Conference on Computer and Communication Security (CCS), 2017.
  4. X. Wang, Y. Guo, T. Rahman, D. Zhang, and M. Tehranipoor, "DOST: Dynamically Obfuscated Wrapper for Split Test against IC Piracy," IEEE Asian Hardware-Oriented Security and Trust Symposium (AsianHOST), 2017.
  5. Z. Guo, X. Xu, M. Tehranipoor, and D. Forte, "MPA: Model-assisted PCB Attestation via Board-level RO and Temperature Compensation," IEEE Asian Hardware-Oriented Security and Trust Symposium (AsianHOST), 2017.
  6. K. Yang, H. Shen, D. Forte, and M. Tehranipoor, "A Split Manufacturing Approach for Unclonable Chipless RFIDs for Pharmaceutical Supply Chain Security," IEEE Asian Hardware-Oriented Security and Trust Symposium (AsianHOST), 2017.
  7. E.L. Principe, N. Asadizanjani, D. Forte, M. Tehranipoor, R. Chivas, M. DiBattista, S. Silverman, M. Marsh, J. Mastovich, J. Odum, "Steps Towards Automated Deprocessing of Integrated Circuits," International Symposium on Test and Failure Analysis (ISTFA), 2017.
  8. A. Nahiyan, M. Sadi, R. Vittal, G. Contreras, D. Forte, and M. Tehranipoor, "Hardware Trojan Detection Through Information Flow Security Verification," International Test Conference (ITC), 2017.
  9. X. Xu, B. Shakiya, M. Tehranipoor, and D. Forte, "Novel Bypass Attack and BDD-based Tradeoff Analysis Against all Known Logic Locking Attacks," Conference on Cryptographic Hardware and Embedded Systems (CHES), 2017.
  10. Z. Guo, M. Tehranipoor, and D. Forte, "Memory-based Counterfeit IC Detection Framework," SRC TECHCON, 2017.
  11. A. Nahiyan, D. Forte, and M. Tehranipoor, "Framework for Automated and Systematic Security Assessment of Modern SoCs," SRC TECHCON, 2017.
  12. J. Park, M. Corba, A. E. de la Serna, R. Vigeant, M. Tehranipoor, and S. Bhunia, "ATAVE: A Framework for Automatic Timing Attack Vulnerability Evaluation," IEEE Mid-West Symposium on Circuits and Systems (MWSCAS), 2017.
  13. S. Amir, B. Shakya, D. Forte, M. Tehranipoor, and S. Bhunia, "Comparative Analysis of Hardware Obfuscation for IP Protection," ACM Great Lake Symposium on VLSI (GLS-VLSI), 2017.
  14. Q. Shi, K. Xiao, D. Forte, and M. Tehranipoor, "Securing Split Manufactured ICs with Wire Lifting Obfuscated Built-In Self-Authentication," ACM Great Lake Symposium on VLSI (GLS-VLSI), 2017.
  15. M. Sadi, S. Kannan, and M. Tehranipoor, "Design of a Digital IP for 3D-IC Die-to-Die Clock Synchronization," IEEE International Symposium on Circuits & Systems (ISCAS), 2017.
  16. Z. Guo, M. Tehranipoor, and D. Forte, "FFD: A Framework for Fake Flash Detection," Design Automation Conference (DAC), 2017.
  17. T. Bryant, S. Chowdhury, D. Forte, M. Tehranipoor and N. Maghari, "A Stochastic All-Digital Weak Physically Unclonable Function for Analog/Mixed-Signal Applications," IEEE Int. Symposium on Hardware-Oriented Security and Trust (HOST), 2017.
  18. N. Karimian, M. Tehranipoor, and D. Forte, "Non-Fiducial PPG-based Authentication for Healthcare Application," Engineering in Medicine and Biology Conference (EMBC), 2017.
  19. N. Karimian, M. Tehranipoor, and D. Forte, "Noise Assessment Framework for Optimizing ECG Key Generation," International Conference on Technologies for Homeland Security, 2017.
  20. D. Zhang, X. Wang, T. He, and M. Tehranipoor, "A Novel Dynamic Obfuscation Scan Design for Protecting IPs against Scan-Based Attack," IEEE VLSI Test Symposium (VTS), 2017.
  21. Q. Shi, N. Asadi, D. Forte, and M. Tehranipoor, "Layout-based Microprobing Vulnerability Assessment for Security Critical Applications," GOMACTech, 2017.
  22. N. Kariminan, Z. Guo, M. Tehranipoor, and D. Forte, "Human Recognition from Photoplethysmography (PPG) Based on Non-fiducial Features," IEEE International Conference on Acoustics, Speech, and Signal Processing (ICASSP), 2017.
  23. G. K. Contreras, A. Nahiyan, S. Bhunia, D. Forte, M. Tehranipoor, "Security Vulnerability Analysis of Design-for-Test Exploits for Asset Protection in SoCs," Asia and South Pacific Design Automation Conference (ASP-DAC), 2017.
  24. R. Karam, T. Hoque, S. Ray, M. Tehranipoor, S. Bhunia, "MUTARCH: Architectural Diversity for FPGA Device and IP Security," Asia and South Pacific Design Automation Conference (ASP-DAC), 2017.
  25. Z. Guo, M. Tehranipoor, and D. Forte, "Aging Attacks for Key Extraction on Permutation-Based Obfuscation," IEEEE Asian Hardware-Oriented Security and Trust (AsianHOST), 2016.
  26. T. Rahman, D. Forte, X. Wang, and M. Tehranipoor, "Enhancing Noise Sensitivity of Embedded SRAMs for Robust True Random Number Generation in SoCs," IEEEE Asian Hardware-Oriented Security and Trust (AsianHOST), 2016.
  27. R. Karam, T. Hoque, S. Ray, M. Tehranipoor and S. Bhunia, "Robust Bitstream Protection in FPGA-based Systems through Low-Overhead Obfuscation," ReConFig, 2016.
  28. M. Sadi, G. Contreras, D. Tran, J. Chen, L. Winemberg, and M. Tehranipoor, "BIST-RM: BIST-Assisted Reliability Management of SoCs Using On-Chip Clock Sweeping and Machine Learning," International Test Conference (ITC), 2016.
  29. M. Alam, M. Tehranipoor, and D. Forte, "Recycled FPGA Detection using Exclusive LUT Path Delay Characterization," International Test Conference (ITC), 2016.
  30. T. Bryant, S. Chowdhury, D. Forte, M. Tehranipoor, and N. Maghari, "A Stochastic Approach to Analog Physical Unclonable Function," IEEE Midwest Symposium on Circuits and Systems (MWSCAS), 2016.
  31. B. Shakya, N. Asadi, D. Forte, and M. Tehranipoor, "Chip Editor: leveraging Circuit Edit for Logic Obfuscation and Trusted Fabrication," IEEE International Conference on Computer-Aided Design (ICCAD), 2016.
  32. N. Karimian, D. Woodard, M. Tehranipoor, and D. Forte, "Biometrics for Authentication in Resource-Constrained Systems," Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), 2016.
  33. G. Contreras and M. Tehranipoor, "Fault Deterministic Vector Analysis and Seed Extraction for LBIST," SRC TECHCON, 2016.
  34. M. He and M. Tehranipoor, "Test-Point Insertion Efficiency Analysis for LBIST Applications," SRC TECHCON, 2016.
  35. M. Sadi and M. Tehranipoor, "BIST-Assisted In-field Aging Reliability Management of SoCs Using On-Chip Clock Sweeping and Machine Learning," SRC TECHCON, 2016.
  36. T. Rahman, D. Forte, and M. Tehranipoor, "SRAM Inspired Design and Optimization for Developing Robust Security Primitives," SRC TECHCON, 2016.
  37. N. Asadizanjani, D. Forte, and M. Tehranipoor, "Non-destructive Bond Pull and Ball Shear Failure Analysis Based on Real Structural Properties," Int. Symposium on Testing and Failure Analysis (ISTFA), 2016.
  38. N. Asadizanjani, H. Chen, B. Shakya, D. Forte, S. Bhunia, and M. Tehranipoor, "A New Methodology to Protect PCBs from Non-destructive Reverse Engineering," Int. Symposium on Testing and Failure Analysis (ISTFA), 2016.
  39. N. Asadizanjani, S. Gattigowda, N. Dunn, D. Forte, and M. Tehranipoor, "A Database for Counterfeit Electronics and Automatic Defect Detection Based on Image processing and Machine Learning," Int. Symposium on Testing and Failure Analysis (ISTFA), 2016.
  40. S. Ray, S. Bhunia, Y. Jin, and M. Tehranipoor, "[Extended Abstract] Security Validation in IoT Space," IEEE VLSI Test Symposium (VTS), 2016.
  41. H. Shen, F. Rahman, B. Shakya, M. Tehranipoor, and D. Forte, "Selective Enhancement of Randomness at the Materials Level: Poly-Si Based Physical Unclonable Functions (PUFs)," IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 2016.
  42. T. Li, J. Di, M. Tehranipoor, D. Forte, and L. Wang, "Tracking Data Flow at Gate-Level through Structural Checking," ACM Great Lake Symposium on VLSI (GLSVLSI), 2016.
  43. A. Zaghi and Mark Tehranipoor, "Major Observations from a Specialized REU Program for Engineering Students with ADHD," American Society for Engineering Education (ASEE), 2016.
  44. F. Rahman, D. Forte, and Mark Tehranipoor, "Reliability vs. Security: Challenges and Opportunities for Developing Reliable and Secure Integrated Circuits," International Reliability Physics Symposium (IRPS), 2016.
  45. M. Sadi and M. Tehranipoor, "BIST-Assisted Reliability Management of SoC Using On-chip Clock Sweeping and Machine Learning," IEEE Reliability Innovations Conference (IRIC), 2016 (extended abstract).
  46. K. Yang, D. Forte, and M. Tehranipoor, "UCR: An Unclonable Chipless RFID Tag," IEEE Symposium on Hardware-Oriented Security and Trust (HOST), 2016.Received Best Paper Nomination
  47. Q. Shi, N. Asadi, D. Forte, and M. Tehranipoor, "A Layout-driven Framework to Assess Vulnerability of ICs to Microprobing Attacks," IEEE Symposium on Hardware-Oriented Security and Trust (HOST), 2016.Received Best Paper Award
  48. Z. Guo, T. Rahman, M. Tehranipoor, and D. Forte, "A Zero-cost Approach to Detect Recycled SoC Chips Using Embedded SRAM," IEEE Symposium on Hardware-Oriented Security and Trust (HOST), 2016.
  49. A. Nahiyan, K. Xiao, D. Forte, Y. Jin, and M. Tehranipoor, "AVFSM: A Framework for Identifying and Mitigating Vulnerabilities in FSMs," Design Automation Conference (DAC), 2016.
  50. Z. Guo, N. Karimian, M. Tehranipoor, and D. Forte, "Hardware Security Meets Biometrics for the Age of IoT," Int. Symposium on Circuits and Systems (ISCAS), 2016.
  51. T. Meade, Y. Jin, M. Tehranipoor, S. Zhang, "Gate-Level Netlist Reverse Engineering for Hardware Security: Control Logic Register Identification," Int. Symposium on Circuits and Systems (ISCAS), 2016.
  52. L. Yu, X. Wang, P. Jiao, A. Chen, D. Su, L. Winemberg, M. Sadi, and M. Tehranipoor, "An Efficient All-Digital Alarmer for DVFS-based SOC," Int. Symposium on Circuits and Systems (ISCAS), 2016.
  53. L. Wu, X. Wang, D. Su, A. Chen, Q. Shi, and M. Tehranipoor, "AES Design Improvement Toward Information Safety," Int. Symposium on Circuits and Systems (ISCAS), 2016.
  54. M. He, G. Contreras, M. Tehranipoor, D. Tran, and L. Winemberg, "Test Point Insertion Efficiency Analysis for LBIST Applications," IEEE VLSI Test Symposium (VTS), 2016.
  55. T. Meade, S. Zhang, M. Tehranipoor, and Y. Jin, "A Comprehensive Netlist Reverse Engineering Toolset for IC Trust," GomacTech, 2016.
  56. N. Asadi, S. Shahbazi, D. Forte, and M. Tehranipoor, "Nondestructive X-ray Tomography Based Bond Pull and Ball Shear Analysis," GomacTech, 2016.
  57. Z. Guo, N. Karimian, M. Tehranipoor, and D. Forte, "Biometric Based Human-to-Device (H2D) Authentication," GomacTech, 2016.
  58. M. Alam, N. Asadi, S. Shahbazi, D. Forte, and M. Tehranipoor, "The Impact of X-ray Tomography on the Reliability of FPGAs," GomacTech, 2016.
  59. B. Shakya, F. Rahman, M. Tehranipoor, and D. Forte, "Security in Nanoscale Regime – A Perspective Paper,"IEEE Microprocessor Test and Verification (MTV), 2015.
  60. K. Ahi, N. Asadi, M. Tehranipoor, and M. Anwar, "Authentication of electronic components by time domain THz Techniques,"Connecticut Microelectronic Symposium (CMOC), 2015 (extended abstract).
  61. K. Yang, D. Forte, and M. Tehranipoor, "Protecting Endpoint Devices in IoT Supply Chain,"International Conference on Computer-Aided Design (ICCAD), 2015.
  62. . Shi, R. Tekumalla, and M. Tehranipoor, "Concurrent Testing of Logic and Memory, and Detection of Memory Functional Paths in SOCs,"International Test Conference, 2015 (inivted), 2015.
  63. B. Shakya, U. Guin, M. Tehranipoor, and D. Forte, "Performance Optimization for On-Chip Sensors to Detect Recycled ICs,"IEEE Int. Conference on Computer Design (ICCD), 2015.
  64. T. Rahman, F. Rahman, D. Forte, and M. Tehranipoor, "A Pair Selection Algorithm for Robust RO-PUF Against Environmental Variations and Aging,"IEEE Int. Conference on Computer Design (ICCD), 2015.
  65. G. Contreras, L. Winemberg, M. Tehranipoor, and N. Ahmed, "Predictive LBIST Model and partial ATPG for Seed Extraction,"IEEE Defect and Fault Tolerant Systems (DFTS), 2015.
  66. S. Chen, J. Chen, D. Forte, J. Di, M. Tehranipoor, and L. Wang, "Chip Level Anti-reverse Engineering using Transformable Interconnects,"IEEE Defect and Fault Tolerant Systems (DFTS), 2015.
  67. N. Asadi, S. Shahbaz, M. Tehranipoor, and D. Forte, "Non-destructive PCB Reverse Engineering Using X-ray Micro Computed Tomography,"Int. Symposium for Testing and Failure Analysis (ISTFA), 2015.
  68. H. Dogan, M. Mahbub, N. Asadi, S. Shahbaz, D. Forte, and M. Tehranipoor, "Analyzing the Impact of X-ray Tomography for Non-destructive Counterfeit Detection,"Int. Symposium for Testing and Failure Analysis (ISTFA), 2015.
  69. K. Ahi, N. Asadi, S. Shahbaz, M. Tehranipoor, and M. Anwar, "Terahertz Characterization of Electronic Components and Comparison of Terahertz Imaging with X-ray Imaging Techniques,"Terahertz Physics, Devices, and Systems, 2015.
  70. K. Yang, D. Forte, and M. Tehranipoor, "ReSC: RFID-enabled Supply Chain Management and Traceability for Network Devices,"RFID Security, 2015.
  71. T. Rahman, D. Forte, and M. Tehranipoor, "Robust SRAM-PUF: Cell Stability Analysis and Novel Bit-Selection Algorithm,"TECHCON, 2015.
  72. M. Sadi and M. Tehranipoor, "An Efficient Speed Binning Methodology for SoC Using On-chip Slack Sensors and Machine Learning,"TECHCON, 2015.
  73. J. Chandy, et. al, "Hardware Hacking: An Approach to Trustable Computing Systems Security Education,"The Colloquium for Information Systems Security Education (CISSE), Las Vegas, June 2015.
  74. Z. Guo, J. Di, M. Tehranipoor, and D. Forte, "Investigation of Obfuscation-based Anti-Reverse Engineering for Printed Circuit Boards,"Design Automation Conference (DAC), 2015.
  75. M. Sadi, X. Wang, L. Winemberg, and M. Tehranipoor, "Speed Binning using Machine Learning and On-chip Slack Sensors,"ACM Great Lake Symposium on VLSI (GLSVLSI), 2015.
  76. M. Sadi and M. Tehranipoor, "Timing Slack Extraction for SoC Reliability Monitoring with Robust Digital Sensor IP and Sensor Insertion Flow,"IEEE Reliability Innovations Conference (IRIC), 2015 (extended abstract).
  77. T. Rahman, A. Hosey, K. Xiao, D. Forte, and M. Tehranipoor, "Cell Stability Analysis and Novel Bit-Selection Algorithm for Robust SRAM-PUF,"Connecticut Microelectronic Symposium (CMOC), 2015.
  78. M. Sadi and M. Tehranipoor, "A Robust Multipurpose Digital Sensor IP for In-situ Path Timing Slack Monitoring in SOCs,"IEEE VLSI Test Symposium (VTS), 2015.
  79. K. Xiao, D. Forte, and M. Tehranipoor, "Efficient and Secure Split Manufacturing via Obfuscated Built-In Self-Authentication,"IEEE Hardware-Oriented Security and Trust (HOST), 2015. Received Best Paper Award
  80. K. Yang, D. Forte, and M. Tehranipoor, "An RFID-based Technology for Electronic Component and System Counterfeit Detection and Traceability,"IEEE International Conference on Technologies for Homeland Security (HST), 2015.
  81. G. Contreras, M. Tehranipoor, N. Ahmed, L. Winemberg, and Y. Zhao, "LBIST Pattern Reduction by Learning ATPG Test Cube Properties,"International Symposium on Quality Electronic Design (ISQED), 2015.
  82. S. Quadir, N. Asadi, D. Forte, and M. Tehranipoor, "Rapid Non-destructive Reverse Engineering of Printed Circuit Boards by High Resolution X-ray Tomography,"GOMACTech, 2015.
  83. T. Rahman, A. Hosey, F. Rahman, D. Forte, and M. Tehranipoor, "RePa: A Pair Selection Algorithm for Reliable KeMys from RO-based PUF,"GOMACTech, 2015.
  84. H. Dogan, D. Forte, and M. Tehranipoor, "Aging Analysis for Recycled FPGA Detection,"GOMACTech, 2015.
  85. X. Wang, L. Winemberg, A. Haggag, J. Chayachinda, A. Saluja and M. Tehranipoor, "Fast Aging Degradation Rate Prediction During Production Test,"International Reliability Physics Symposium (IRPS), 2014.
  86. M. Sadi, Z. Conroy, B. Eklow, M. Kamm, N. Bidokhti, and M. Tehranipoor, "An All-Digital Distributed Sensor Network Based Framework for Continuous Noise Monitoring and Timing Failure Analysis in SOCs,"IEEE Asian Test Symposium (ATS), 2014.
  87. A. Hosey, T. Rahman, K. Xiao, D. Forte, and M. Tehranipoor, "Advanced Analysis of Cell Stability for Reliable SRAM PUFs,"IEEE Asian Test Symposium (ATS), 2014.
  88. H. Dogan, D. Forte, and M. Tehranipoor, "Aging Analysis for Recycled FPGA Detection,"IEEE Int. Symposium on Defect and Fault Tolerance Symposium (DFTS), Oct. 2014.
  89. M. He and M. Tehranipoor, "SAM: A Comprehensive Mechanism for Accessing Embedded Sensors in Modern SoCs,"IEEE Int. Symposium on Defect and Fault Tolerance Symposium (DFTS), Oct. 2014.
  90. T. Rahman, D. Forte, Q. Shi, G. Contreras, and M. Tehranipoor, "CSST: Preventing Distribution of Unlicensed and Rejected ICs by Untrusted Foundry and Assembly,"IEEE Int. Symposium on Defect and Fault Tolerance Symposium (DFTS), Oct. 2014.
  91. M. Sadi and M. Tehranipoor, "A SOC Noise Monitoring and Diagnosis with Fully Digital On-Chip Distributed Sensor Network,"SRC TECHCON, 2014.
  92. G. Contreras and M. Tehranipoor, "Improving LBIST Pattern Quality and Test Point Reduction,"SRC TECHCON, 2014.
  93. Q. Shi, X. Wang, L. Winemberg, and M. Tehranipoor, "On-Chip Sensor Selection for Effective Speed-Binning,"IEEE Mid-West Symposium on Circuits and Systems (MWSCAS), Oct. 2014.
  94. S. Shahbaz, D. Forte, and M. Tehranipoor, "Advanced Physical Inspection Methods for Counterfeit Detection,"Int. Symposium for Testing and Failure Analysis (ISTFA), 2014.
  95. S. Shahbaz, D. Forte, and M. Tehranipoor, "Advanced Physical Inspection Techniques for Counterfeit IC Detection,"Calce Symposium on Counterfeit Electronics and Supply Chain, June 2014.
  96. T. Rahman, D. Forte, Q. Shi, G. Contreras, and M. Tehranipoor, "CSST: An Efficient Secure Split-Test for Preventing IC Piracy," IEEE North Atlantic Test Workshop (NATW), 2014.
  97. G. Contreras, N. Ahmed, L. Winemberg, and M. Tehranipoor, "TAME-TPI: A Timing-Aware Metric for Efficient Test Point Insertion and Area Overhead Reduction," IEEE North Atlantic Test Workshop (NATW), 2014.
  98. M. Sadi and M. Tehranipoor, "On-Chip Sensors for Chip Timing Failure Analysis," Connecticut Symposium on Microelectronics and Optoelectronics (CMOC), 2014.
  99. M. Sadi, Z. Conroy, M. Kamm, B. Eklow, N. Bidokhti and M. Tehranipoor, "System on Chip Noise Reliability Testing and Monitoring with Light-Weight Fully Digital Embedded Sensor Network," IEEE International Reliability Innovation Conference (IRIC), 2014.
  100. K. Xiao, T. Rahman, D. Forte, M. Tehranipoor, M. Su, and Y. Huang, "Bit Selection Algorithm Suitable for High Volume Production of SRAM PUF," IEEE International Symposium on Hardware-Oriented Security and Trust (HOST), 2014.
  101. U. Guin, D. Forte, and M. Tehranipoor, "Low-Cost On-Chip Structures for Combating Die and IC Recycling," Design Automation Conference (DAC), 2014.
  102. T. Rahman, K. Xiao, D. Forte, X. Zhang, Z. Shi, and M. Tehranipoor, "TI-TRNG: Technology Independent True Random Number Generator," Design Automation Conference (DAC), 2014.
  103. J. Chen, L. Winemberg, and M. Tehranipoor, "Identification of Testable Representative Paths for Low-Cost Verification of Circuit Performance During Manufacturing Tests and in the Field," IEEE VLSI Test Symposium (VTS), 2014.
  104. S. Hamdiui, G. Di Natalie, G. van Battum, J. Danger, F. Smailbegovic, and M. Tehranipoor, "Hacking and Protecting IC Hardware," Design, Automation, and Test in Europe (DATE), 2014.
  105. T. Rahman, D. Forte, M. Tehranipoor, and J. Fahrny, "ARO-PUF: An Aging-Resistant Ring-Oscillator PUF Design," Design, Automation, and Test in Europe (DATE), 2014.
  106. K. Xiao, T. Rahman, D. Forte, M. Tehranipoor, Y. Huang, and M. Su, "Low-cost Analysis of SRAM PUFs for Identification of Mass-Produced Electronic Devices," GOMACTech, 2014.
  107. U. Guin, D. Forte, D. DiMase, and M. Tehranipoor, "Counterfeit IC Detection: Test Method Selection Considering Test Time, Cost, and Tiel Level Risk," GOMACTech, 2014.
  108. U. Guin, D. Forte, and M. Tehranipoor, "Low-cost On-Chip Structures for Combating Die and IC Recycling," GOMACTech, 2014.
  109. N. Bidokhti, M. Tehranipoor, J. Chen, and J. Lee, "Life After Failure," Reliability and Maintainability Symposium (RAMS), 2014.
  110. U. Guin, D. Forte, and M. Tehranipoor, "Anti-Counterfeit Techniques: From Design to Resign," IEEE Microprocessor Test Verification (MTV), 2013.
  111. J. Chen and M. Tehranipoor, "Critical Paths Selection and Test Cost Reduction Considering Process Variations," IEEE Asian Test Symposium (ATS), 2013.
  112. F. Bao, H. Chen, and M. Tehranipoor, "Worst-case Critical-Path Delay Analysis Considering Power-Supply Noise," IEEE Asian Test Symposium (ATS), 2013.
  113. A. Tomita, X. Wen, Y. Sato, S. Kajihara, P. Girard, M. Tehranipoor, and L.T. Wang, "On Achieving Capture Power Safety in At-speed Scan-based Logic BIST," IEEE Asian Test Symposium (ATS), 2013.
  114. U. Guin and M. Tehranipoor, "CDIR: Low-Cost Combating Die/IC Recycling Structures," DMSMS, 2013 (Extended Abstract).
  115. U. Guin, D. DiMase, and M. Tehranipoor, "CDIR: Low-Cost Combating Die/IC Recycling Structures," DMSMS, 2013 (Extended Abstract).
  116. A. Mazady, H. Chi Chou, M. Tehranipoor and M. Anwar, "Terahertz Spectroscopy: A Technology Platform for the Detection of Counterfeit Electronics," DMSMS, 2013 (Extended Abstract).
  117. U. Guin, T. Chakraborty, and M. Tehranipoor, "Novel DFTs for Circuit Initialization to Reduce Functional Fmax Test Time," IEEE Int. Conference on Computer Design (ICCD), 2013.
  118. H. Salmani, M. Tehranipoor, and R. Karri, "Trust Benchmarks and Design Vulnerability Analysis," IEEE Int. Conference on Computer Design (ICCD), 2013.
  119. G. Contreras, T. Rahman, and M. Tehranipoor, "Secure Split-Test for Preventing IC Piracy by Untrusted Foundry and Assembly," Int. Symposium on Defect and Fault Tolerance in VLSI Systems (DFT), 2013.
  120. H. Salmani and M. Tehranipoor, "Analyzing Circuit Vulnerability to Hardware Trojan Insertion at the Behavioral Level," Int. Symposium on Defect and Fault Tolerance in VLSI Systems (DFT), 2013.
  121. Q. Shi, J. Chen, and M. Tehranipoor, "Silicon Data Based Delay Analysis and PDF Pattern Generation for Advanced Technology Node," SRC TECHCON, September 2013.
  122. M. Tehranipoor, "An All-in-One Anti-Counterfeiting Technology for Integrated Circuits," Symposium on Counterfeit Electronic Parts and Electronic Supply Chain, June 2013.
  123. Q. Shi, X. Wang, L. Winemberg, and M. Tehranipoor, "Experimental Analysis of Variations' Impact on Integrated Circuits Performance in Advanced Technology Nodes," IEEE North Atlantic Test Workshop (NATW), 2013.
  124. U. Guin, T. Chakraborty, and M. Tehranipoor, "Novel DFTs for Circuit Initialization to Reduce Functional Fmax Test Time," IEEE North Atlantic Test Workshop (NATW), 2013.
  125. U. Guin and M. Tehranipoor, "On Selection of Counterfeit IC Detection Methods," IEEE North Atlantic Test Workshop (NATW), 2013.Received Best Paper Award
  126. K. X. Zhang, K. Xiao, M. Tehranipoor, J. Rajendran, and R. Karri, "A Study on the Effectiveness of Trojan Detection Techniques using a Red Team Blue Team Approach," IEEE VLSI Test Symposium (VTS), 2013.
  127. K. Xiao and M. Tehranipoor, "Built-In Self-Authentication for Preventing Hardware Trojan Insertion," Int. IEEE Symposium on Hardware-Oriented Security and Trust (HOST), 2013.
  128. G. Contreras and M. Tehranipoor, "ATPG Learning BIST for Increasing Pattern Effectiveness," IEEE International Reliability Innovation Conference (IRIC), 2013.
  129. J. Chen and M. Tehranipoor, "Efficient Skew Reduction for Clock Tree Design Considering NBTI and Process Variation," IEEE International Reliability Innovation Conference (IRIC), 2013.
  130. M. Tehranipoor and U. Guin, "Counterfeit Detection Technology Assessment," GOMACTech-2013.
  131. M. Tehranipoor and K. Xiao, "BISA: Built-In Self-Authentication to Prevent Insertion of Trojans by Untrusted Foundry," GOMACTech-2013.
  132. J. Chen and M. Tehranipoor, "A Novel Flow for Reducing Clock Skew Considering NBTI Effect and Process Variations," Int. Symposium on Quality Electronics Design (ISQED), 2013.
  133. W. Zhao and M. Tehranipoor, "PowerMAX: Fast Power Analysis During Test," IEEE Asian Test Symposium (ATS), 2012 (invited).
  134. X. Wang, D. Tran, S. George, L. Winemberg, N. Ahmed, S. Palosh, A. Dobin, and M. Tehranipoor, "Radic: A standard-cell Based Sensor for On-Chip Aging and Flip-Flop Metastability Measurements" Int. Test Conference (ITC), 2012.
  135. X. Wen, Y. Nishida, K. Miyase, S. Kajihara, P. Girard, M. Tehranipoor, and L.T. Wang, "On Pinpoint Capture Power Management in At-Speed Scan Test Generation," Int. Test Conference (ITC), 2012.
  136. S. Wang, J. Chen, and M. Tehranipoor, "Representative Critical Reliability Paths for Low-Cost and Accurate On-Chip Aging Evaluation," Int. Conf. on Computer-Aided Design (ICCAD), 2012.
  137. A. Ferraiuolo, X. Zhang, and M. Tehranipoor, "Experimental Analysis of a Ring Oscillator Network for Hardware Trojan Detection in a 90nm ASIC" Int. Conf. on Computer-Aided Design (ICCAD), 2012
  138. X. Zhang, K. Xiao, and M. Tehranipoor, "Path-Delay Fingerprinting for Identification of Recovered ICs" in Proc. IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS), 2012. Received Best Student Paper Award
  139. M. Tehranipoor, "SST: Secure Split-Test for Preventing IC Piracy and Easy Detection," DMSMS & Standardization, 2012.
  140. N. Murphy, U. Guin, and M. Tehranipoor, "Counterfeit Detection Technology Assessment," DMSMS & Standardization, 2012.
  141. X. Zhang, N. Tuzzio, and M. Tehranipoor, "Identification of Recovered ICs using Fingerprints from a Light-Weight On-Chip Sensor," IEEE/ACM Design Automation Conference (DAC), 2012.
  142. S. Wang, Q. Shi, J. Chen, and M. Tehranipoor, "On-Chip Structures and Test Methodologies for Analyzing Performance Degradation in Modern Designs," SRC TECHCON, 2012.
  143. N. Tuzzio, K. Xiao, X. Zhang, and M. Tehranipoor, "A Zero-Overhead IC Identification Technique using Clock Sweeping and Path Delay Analysis" IEEE GLSVLSI, 2012.
  144. S. Wang and M. Tehranipoor, "TSUNAMI: "A Light-Weight On-Chip Structure for Measuring Timing Uncertainty Induced by Noise during Functional and Test Operations," IEEE GLSVLSI, 2012.
  145. J. Chen, S. Wang, and M. Tehranipoor, "Efficient Selection and Analysis of Critical Reliability Paths and Gates," IEEE GLS-VLSI, 2012.
  146. M. Tehranipooor, "Combating IC Recovery for Improving Reliability and Security of Digital Integrated Circuits," IEEE Int. Reliability Innovations Conference (IRIC), 2012 (Extended Abstract).
  147. M. Tehranipoor, L. Winemberg, and N. Bidokhti, "Timing Analysis and On-Chip Measurement Considering Aging," IEEE Int. Reliability Innovations Conference (IRIC), 2012 (Extended Abstract).
  148. W. Zhao, S. Chakravarty, J. Ma, N. Devta-Prasanna, F. Yang, M. Tehranipoor, "A Novel Method for Fast Identification of Peak Current during Test," IEEE VLSI Test Symposium (VTS), 2012.
  149. X. Zhang, N. Tuzzio, and M. Tehranipoor, "CDR: Combating Die Recovery," GOMACTech, Las Vegas, 2012.
  150. M. Li, A. Davoodi, and M. Tehranipoor, "A sensor-assisted self-authentication framework for hardware Trojan detection",  in Proc. Design, Automation, and Test in Europe (DATE), 2012.
  151. X. Zhang, N. Tuzzio, and M. Tehranipoor, "Red Team: Design of Intelligent Hardware Trojans with Known Defense Schemes," Int. Conference on Computer Design (ICCD), 2011.
  152. F. Bao, K. Peng, K. Chakrabarty, and M. Tehranipoor, "On Generation of 1-Detect TDF Pattern Set with Significantly Increased SDD Coverage," IEEE Asian Test Symposium (ATS), 2011.
  153. H. Slamani, M. Tehranipoor, S. Chakravarty, X. Wen, and P. Girard, "Layout-Aware Pattern Evaluation and Analysis for Power-Safe Application of TDF Patterns," IEEE LPonTR, 2011.
  154. F. Wu, L. Dilillo, A. Bosio, P. Girard, M. Tehranipoor, K. Miyase, X. Wen, N. Ahmed, "Mapping Test Power to Functional Power Through Smart X-Filling for LOS Scheme," IEEE LPonTR, 2011.
  155. J. Chen and M. Tehranipoor, "On-Chip Structures and Methodologies for Reliable Circuit Design," Psoter, SRC TECHCON, 2011.
  156. S. Wang, L. Winemberg, and M. Tehranipoor, "In-Field Aging Measurement and Calibration for Power-Performance Optimization," in Proc. Design Automation Conference (DAC), 2011.
  157.  W. Zhao and M. Tehranipoor, "Peak Power Identification on Power Bumps During Test Application," Low Power SOC Workshop (LPSOC), 2011 (Invited).
  158. X. Zhang and M. Tehranipoor, "Case Study: Detecting Hardware Trojans in Third-Party Digital IP Cores," in Int. IEEE Hardware-Oriented Security and Trust (HOST), 2011.
  159. F. Bao, K. Peng, M. Yilmaz, K. Chakrabarty, and M. Tehranipoor, "Critical Fault-Based Pattern Generation for Screening Small Delay Defects," in proc. European Test Symposium (ETS), 2011.
  160. S. Wang and M. Tehranipoor, "Aging Measurement and Calibration for Nanoscale VLSI Circuit," Connecticut Symposium on Microelectronics and Optoelectronics (CMOC), 2011 (Invited).
  161. J. Chen and M. Tehranipoor, "Timing Analysis for Nanometer VLSI Designs Considering Aging Effects," Connecticut Symposium on Microelectronics and Optoelectronics (CMOC), 2011 (Poster).
  162. X. Zhang and M. Tehranipoor, "RON: An On-chip Ring Oscillator Network for Hardware Trojan Detection," Design, Automation, and Test in Europe (DATE), 2011.
  163. F. Wu, L. Dilillo, A. Bosio, P. Girard, S. Pravossoudovitch, A. Virazel, M. Tehranipoor, K. Miyase, X. Wen, and N. Ahmed, "Power Reduction Through X-filling of Transition Fault Test Vectors for LOS Testing," in Design & Technology of Integrated Systems (DTIS), 2011.
  164. W. Zhao, S. Chakravarty, and M. Tehranipoor, "Power-Safe Test Application Using An Effective Gating Approach Considering Current Limits," IEEE VLSI Test Symposium (VTS), 2011.
  165. K. Peng, F. Bao, G. Shofner, L. Winemberg, and M. Tehranipoor, "Case Study: Efficient SDD Test Generation for Very Large Integrated Circuits," IEEE VLSI Test Symposium (VTS), 2011
  166. J. Ma, N. Ahmed, and M. Tehranipoor, "Low-Cost Diagnostic Pattern Generation and Evaluation Procedures for Noise-Related Failures," IEEE VLSI Test Symposium (VTS), 2011.
  167. X. Wen, K. Enokimoto, K. Miyase, Y. Yamato, M. Kochte, S. Kajihara, P. Girard, M. Tehranipoor, "Power-Aware Test Generation with Guaranteed Launch Safety for At-Speed Scan Testing," IEEE VLSI Test Symposium (VTS), 2011.
  168.  X. Zhang and M. Tehranipoor, "Verifying Trustworthiness of Integrated Circuits," GOMACTech, 2011 (Invited).
  169. J. Chen, S. Wang, N. Bidokhti, and M. Tehranipoor, "A Framework for Fast and Accurate Critical-Reliability Paths Identification," IEEE North Atlantic Test Workshop (NATW), 2011.
  170. F. Bao, K. Peng, K. Chakrabarty, L. Winemberg, and M. Tehranipoor, "Increasing SDD Coverage without Increasing Pattern Count," IEEE North Atlantic Test Workshop (NATW), 2011.
  171. N. Reddy, S. Wang, L. Winemberg, and M. Tehranipoor, "Experimental Analysis for Aging in Integrated Circuits," IEEE North Atlantic Test Workshop (NATW), 2011.
  172. J. Ma, M. Tehranipoor, O. Sinanoglu, and S. Almukhaizim, "Identification of IR-drop Hot-spots in Defective Power Distribution Network Using TDF ATPG," IEEE International Workshop on Design and Test (IDT), Abu Dhabi, 2010.
  173. M. Tehranipoor, "Dealing with Reliability and Variability Issues in Nanometer Technology Designs," Connecticut Symposium on Microelectronics and Optoelectronics (CMOC), 2010 (Invited).
  174. H. Salmani, M. Tehranipoor, and J. Plusquellic, "A Layout-Aware Approach for Improving Localized Switching to Detect Hardware Trojans in Integrated Circuits," IEEE International Workshop on Information Forensics and Security (WIFS), 2010.
  175. W. Zhao, J. Ma, M. Tehranipoor, and S. Chakravarty, "Power-Safe Application of Transition Delay Fault Patterns Considering Current Limit during Wafer Test," IEEE Asian Test Symposium (ATS), 2010.
  176. K. Peng, M. Yilmaz, K. Chakrabarty, and M. Tehranipoor, "A Noise-Aware Hybrid Method for SDD Pattern Grading and Selection," IEEE Asian Test Symposium (ATS), 2010.
  177. S. Goel, K. Chakrabarty, M. Yilmaz, K. Peng, and M. Tehranipoor, "Circuit Topology-Based Test Pattern Generation for Small-Delay Defects," IEEE Asian Test Symposium (ATS), 2010.
  178. F. Wu, L. Dilillo, A. Bosio, P. Girard, S. Pravossoudovitch, A. Virazel, M. Tehranipoor, K. Miyase, X. Wen, and N. Ahmed, "Power reduction Through X-filling of Transition Fault Vectors for LOS Testing," International Workshop on the Impact of Low Power design on Test and Reliability (LPonTR), 2010.
  179. K. Peng, Y. Huang, W. T. Cheng, and M. Tehranipoor, "Full-Circuit SPICE Simulation Based Validation of Dynamic Delay Estimation," European Test Symposium (ETS), 2010.
  180. F. Wu, L. Dilillo, A. Bosio, P. Girard, S. Pravossoudovitch, A. Virazel, M. Tehranipoor, J. Ma, W. Zhao, X. Wen, "Analysis of Power Consumption and Transition Fault Coverage for LOS and LOC Testing Schemes," DDECS, 2010.
  181. X. Wang and M. Tehranipoor, "Low-Cost On-Chip Structures for Measuring NBTI Effects, Variations, Path Delay, and Noise," SRC TECHCON, Poster Presentation, 2010. Received Best in Session Award
  182. J. Ma and M. Tehranipoor, "A Low-Cost Diagnostic Procedure for Parametric Failures Caused by Pattern-Induced Noises," SRC TECHCON, Poster Presentation, 2010.
  183. J. Ma, J. Lee, N. Ahmed, P. Girard, and M. Tehranipoor, "Pattern Grading for Testing Critical Paths Considering Power Supply Noise and Crosstalk Using a Layout-Aware Quality Metric," in ACM Great-Lake Symposium on VLSI (GLS-VLSI), 2010.
  184. K. Peng, J. Thibodeau, M. Yilmaz, K. Chakrabarty, and M. Tehranipoor, "A Novel Hybrid Method for SDD Pattern Grading and Selection," in IEEE VLSI Test Symposium (VTS), 2010.
  185. X. Wang and M. Tehranipoor, "Novel Physical Unclonable Function Based on Process and Environmental Variations," in Design, Automation, and Test in Europe (DATE), 2010.
  186. K. Peng, M. Yilmaz, K. Chakrabarty, and M. Tehranipoor, "High-Quality Pattern Selection for Screening Small-Delay Defects Considering Process Variations and Crosstalk," in Design, Automation, and Test in Europe (DATE), 2010.
  187. K. Peng, Y. Huan, R. Guo, W. T. Cheng, and M. Tehranipoor, "Emulating and Diagnosing IR-Drop by Using Dynamic SDF," in ASP-DAC, 2010.
  188. K. Peng, Y. Huang, W. T. Cheng, and M. Tehranipoor, "Efficient Modeling of IR-Drop Using Dynamic SDF for Test and Diagnosis," in IEEE Workshop on RTL and High Level Testing (WRTLT), 2009.
  189. X. Wang, M. Tehranipoor, and R. Datta, "A Novel Architecture for On-Chip Path Delay Measurement," in International Test Conference (ITC), 2009.
  190. J. Ma, J. Lee, and M. Tehranipoor, "Extended Abstract: Developing a Novel Quality Metric for Path-Delay Fault Pattern Evaluation," in IEEE Int. Workshop on Defect and Data Driven Testing (D3T), 2009.
  191. K. Peng, M. Yilamaz, K. Chakrabarty, and M. Tehranipoor, "Efficient Pattern Grading for Small Delay Defects in Digital Integrated Circuits," IEEE North Atlantic Test Workshop (NATW), May 2009.Received Best Paper Award
  192. H. Salmani, M. Tehranipoor, and J. Plusquellic, "New Design Strategy for Improving Hardware Trojan Detection and Reducing Trojan Activation Time," in IEEE Workshop on Hardware-Oriented Security and Trust (HOST), 2009.
  193. J. Ma, J. Lee, and M. Tehranipoor, "Layout-Aware Pattern Generation for Maximizing Supply Noise Effects on Critical Paths," in Proc. IEEE VLSI Test Symposium (VTS), 2009.
  194. J. Ma, J. Lee, and M. Tehranipoor, "Layout-Aware Pattern Generation for Critical Paths Considering Supply Voltage Noise," Poster Presentation, SRC TECHCON, Austin, TX, 2009.Received Best in session Award
  195. H. Furukawa, X. Wen, K. Miyase, Y. Yamoto, S. Kajihara, P. Girard, L.T. Wang, M. Tehranipoor, "CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme for Reducing Yield Loss Risk in At-Speed Testing," in Proc. IEEE Asian Test Symposium (ATS), 2008.
  196. J. Ma, J. Lee, M. Tehranipoor, X. Wen, A. Crouch, "Identification of IR-drop Hot-spots in Defective Power Distribution Network Using TDF ATPG," in Proc. Int. Workshop on Defect and Data Driven Testing (D3T), 2008.
  197. M. tehranipoor, "ATPG for Increased Test Quality and In-Field Reliability," DRV Workshop, 2008 (Invited).
  198. X. Wang, M. Tehranipoor, and R. Datta, "Path-RO: A Novel On-Chip Critical Path Delay Measurement Under Process Variations," in Proc. International Conference on Computer-Aided Design (ICCAD), Nov. 2008.
  199. R. Rad, X. Wang, J. Plusquellic, and M. Tehranipoor, "Taxonomy of Trojans and Methods of Detection for IC Trust," in Proc. International Conference on Computer-Aided Design (ICCAD), Nov. 2008.
  200. X. Wang, H. Salmani, M. Tehranipoor, and J. Plusquellic, "Hardware Trojan Detection and Isolation Using Current Integration and Localized Current Analysis," in Proc. International Symposium on Fault and Defect Tolerance in VLSI Systems (DFT), Oct. 2008.
  201. X. Wang, M. Tehranipoor, and R. Datta "Accurate On-Chip Path Delay Measurement," Texas Instruments Symposium on Test (TIST), Aug.  2008
  202. J. Lee and M. Tehranipoor, "A Novel Test Pattern Generation Framework for Inducing Maximum Crosstalk Effects on Delay-Sensitive Paths," in Proc. IEEE International Test Conference (ITC), Oct. 2008.
  203. M. Yilmaz, K. Chakrabarty and M. Tehranipoor, "Interconnect-Aware and Layout-Oriented Test-Pattern Selection for Small-Delay Defects," in Proc. IEEE International Test Conference (ITC), Oct. 2008.
  204. J. Ma, J. Lee, and M. Tehranipoor, "Power Distribution Failure Analysis Using Transition-Delay Fault Pattern Generation," Poster presentation at IEEE International Test Conference (ITC), Oct. 2008.
  205. X. Wang, M. Tehranipoor, and R. Datta "Path-RO: On-Chip Critical Path Delay Measurement Under Process Variations," IEEE North Atlantic Test Workshop (NATW), May 2008.Received Best Paper Award
  206. J. Ma, J. Lee, M. Tehranipoor, and A. Crouch "Test Pattern Generation for Open Defects in Power Distribution Networks," IEEE North Atlantic Test Workshop (NATW), May 2008.
  207. J. Lee, S. Narayan, and M. Tehranipoor, "Low-Power Transition-Delay Fault Pattern Generation," IEEE North Atlantic Test Workshop (NATW), May 2008.Received Honorable Mention for Best Paper Award
  208. X. Wang, M. Tehranipoor, and J. Plusquellic, "Detecting Malicious Inclusions in Secure Hardware: Challenges and Solutions," IEEE Int. Hardware-Oriented Security and Trust (HOST), 2008.
  209. R. Rad, J. Plusquellic, and M. Tehranipoor, "Sensitivity Analysis to Hardware Trojans using Power Supply Transient Signals," IEEE Int. Hardware-Oriented Security and Trust (HOST), 2008.
  210. J. Lee and M. Tehranipoor, "LS-TDF: Low Switching Transition Delay Fault Test Pattern Generation," in Proc. IEEE VLSI Test Symposium (VTS), 2008.
  211. M. Yilmaz, K. Chakrabarty, and M. Tehranipoor, "Test Grading and Pattern Selection for Small Delay Defects," in Proc. IEEE VLSI Test Symposium (VTS), 2008.
  212. J. Lee, S. Narayan, M. Kapralos, and M. Tehranipoor, "Layout-aware, IR-drop Tolerant Transition Fault Pattern Generation," in Proc. Design, Automation, and Test in Europe (DATE), 2008.
  213. J. Lee, K. Peng, and M. Tehranipoor, "Inducing Maximum Crosstalk Effects on Delay-Sensitive Paths," Poster presentation, SRC TECHCON, Austin, TX, 2008.
  214. M. Yilmaz, K. Chakrabarty and M. Tehranipoor, "Test Pattern Grading for Small Delay Defects," Int. Workshop on Defect-Based Testing (DBT'07), 2007.
  215. R. Helinski, J. Plusquellic and M. Tehranipoor, "Small Delay Defect Detection Using Self-Relative Timing Bounds," Int. Workshop on Defect-Based Testing (DBT'07), 2007.
  216. J. Lee and M. Tehranipoor,  "Delay Fault Testing in Presence of Maximum Crosstalk," 16th IEEE North Atlantic Test Workshop (NATW'07), Boxborough, MA, 2007.
  217. N. Ahmed, M. Tehranipoor and V. Jayaram, "IR-drop Tolerant Transition Delay Fault Testing," 16th IEEE North Atlantic Test Workshop (NATW'07), Boxborough, MA, 2007.
  218. N. Ahmed, M. Tehranipoor and V. Jayaram, "Transition Delay Fault Test Pattern Generation Considering Supply Voltage Noise in a SOC Design," in Proc. Design Automation Conference (DAC'07), 2007.
  219. N. Ahmed, M. Tehranipoor and V. Jayaram, "Supply Voltage Noise Aware ATPG for Transition Delay Faults," in Proc. IEEE VLSI Test Symposium (VTS'07), 2007.
  220. N. Ahmed and M. Tehranipoor, "Supply Voltage Noise Aware ATPG for Transition Delay Faults," TECHCON, Austin, TX 2007.
  221. N. Ahmed, M. Tehranipoor and V. Jayaram, "Improving ATPG and Pattern Selection for Screening Small Delay Defects," IEEE Int. Workshop on Current and Defect Based Testing (DBT'06), 2006.
  222. J. Plusquellic, D. Acharyya, A. Singh, M. Tehranipoor and C. Patel, "Multiple Supply Pad IDDQ_based Defect Detection Techniques Applied to Hardware Test Chips," IEEE Int. Workshop on Current and Defect Based Testing (DBT'06), 2006.
  223. J. Plusquellic, D. Acharyya, A. Singh, M. Tehranipoor and C. Patel, "Triangulating to a Defect's Physical Coordinates Using Multiple Supply Pad IDDQs: Test Chip Results," in Proc. International Symposium for Testing and Failure Analysis Conference (ISTFA'06), 2006.
  224. N. Ahmed, M. Tehranipoor and V. Jayaram, "A Novel Framework for Faster-than-at-Speed Delay Test Considering IR-Drop Effects," in Proc. Int. Conf. on Computer-Aided Design (ICCAD'06), 2006.
  225. R. M. Rad and M. Tehranipoor, "A New Hybrid FPGA Using Nanoscale Cluster and CMOS Scale Routing," in Proc. Design Automation Conference (DAC'06), 2006.
  226. N. Ahmed, M. Tehranipoor and V. Jayaram, "Timing-Based Delay Test for Screening Small Delay Defects," in Proc. Design Automation Conference (DAC'06), 2006.Best Paper Candidate
  227. R. M. Rad and M. Tehranipoor, "A Reconfiguration-based Defect Tolerance Method for Nanosclae Devices," in Proc. Int. Symposium on Defect and Fault Tolerance of VLSI Systems (DFT'06), 2006.
  228. R. M. Rad and M. Tehranipoor, "SCT: An Approach for Testing and Configuring Nanoscale Devices," in Proc. IEEE VLSI Test Symposium (VTS'06), 2006.
  229. J. Lee, M. Tehranipoorand J. Plusquellic, "A Low-Cost Solution for Protecting IPs Against Side-Channel Scan-Based Attacks," In Proc. IEEE VLSI Test Symposium (VTS'06), 2006.
  230. R. M. Rad and M. Tehranipoor, "Test Time and Defect Map Analysis of PLA and LUT-Based Nano-Architectures," IEEE North Atlantic Test Workshop (NATW'06), 2006.
  231. N. Ahmed, M. Tehranipoor and V. Jayaram, "A Case Study of IR-Drop Effects During Faster-than-at-Speed Delay Test," IEEE North Atlantic Test Workshop (NATW'06), 2006.
  232. J. Plusquellic, D. Acharyya, A. Singh, M. Tehranipoor and C. Patel, "Triangulating to a Defect's Physical Coordinates Using Multiple Supply Pad IDDQs: Test Chip Results," IEEE North Atlantic Test Workshop (NATW'06), 2006.
  233. J. Lee, N. Ahmed, M. Tehranipoor, V. Jayaram and J. Plusquellic, "A Novel Framework for Functionally Untestable Transition Fault Avoidance during ATPG," IEEE North Atlantic Test Workshop (NATW'06), 2006.
  234. R. M. P. Rad and M. Tehranipoor, "Fine-Grained Island Style Architecture for Molecular Electronic Devices," International Symposium on Field-Programmable Gate Arrays (FPGA'06) (Poster), 2006.
  235. M. Tehranipoor and R. M. P. Rad, "Test and Recovery for Fine-Grained Nanoscale Architectures," International Symposium on Field-Programmable Gate Arrays (FPGA'06) (Poster), 2006.
  236. M. ElShoukry, C.P. Ravikumar and M. Tehranipoor, "Partial Gating Optimization for Power Reduction During Test Application," in Proc. IEEE 14th Asian Test Symposium (ATS'05), 2005.
  237. M. Tehranipoor, M. Nourani and N. Ahmed, "Low Transition LFSR for BIST-Based Applications," in Proc. IEEE 14th Asian Test Symposium (ATS'05), 2005.
  238. C.P. Ravikumar, N. Ahmed and M. Tehranipoor, "Practicing Transition-Fault Testing with Physical-Design-Friendly Flows," Texas Instruments India Technical Conference (TIITC'05), 2005.
  239. J. Lee, M. Tehranipoor, C. Patel and J. Plusquellic, "Securing Scan Design Using Lock & Key Technique," in Proc. International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05), 2005.
  240. N. Ahmed and M. Tehranipoor, "Improving Transition Delay Fault Coverage Using Hybrid Scan-Based Technique," in Proc. International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05), 2005.
  241. M. Tehranipoor, "Defect Tolerance for Molecular Electronics-Based NanoFabrics Using Built-In Self-Test Procedure," in Proc. International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05), 2005.
  242. M. Alisafaee, S. M. Fakhraie and M. Tehranipoor, "Architecture of an Embedded Queue Management Engine for High-Speed Network Devices," in Proc. IEEE MidWest Symposium on Circuits and Systems (MWSCAS'05), Cincinnati, 2005.
  243. H. Esmaeilzadeh, F. Farzan, N. Shahidi, S. M. Fakhraie, C. Lucas and M. Tehranipoor, "NnSP: Embedded Neural Networks Stream Processor," in Proc. IEEE MidWest Symposium on Circuits and Systems (MWSCAS'05), 2005.
  244. N. Ahmed, M. Tehranipoor and C.P. Ravikumar, "Addressing At-speed Fault   Coverage and Test Cost Issues Using Enhanced Launch-off-Capture," Texas Instruments Symposium on Test (TIST'05), 2005.
  245. N. Ahmed, M. Tehranipoor and C.P. Ravikumar, "At-Speed Local Scan Enable Generation for Transition Fault Testing Using Low-Cost Testers," Texas Instruments Symposium on Test (TIST'05), 2005 (Ranked 5th Among 89 Presentations).
  246. N. Ahmed, M. Tehranipoor and C.P. Ravikumar, "Enhanced Launch-off-Capture Transition Fault Testing," in Proc. IEEE International Test Conf. (ITC'05), 2005 (Received Top Ten Paper Recognition).
  247. N. Ahmed, M. Tehranipoor, C.P. Ravikumar and J. Plusquellic, "At-Speed Transition Fault Testing Using Low Speed Testers With Application to Reduced Scan Enable Routing Area," IEEE North Atlantic Test Workshop (NATW'05), pp. 112-119, 2005.
  248. D. Acharyya, A. singh, M. Tehranipoor, C. Patel and J. Plusquellic, "Sensitivity Analysis of Quiescent Signal Analysis for Defect Detection," IEEE. Int. Workshop on Defect Based Testing (DBT'05), pp. 3-10, 2005.
  249. M. Nourani, M. Tehranipoor and N. Ahmed, "Pattern Generation and Estimation for Power Supply Noise Analysis," in proc. IEEE VLSI Test Symposium (VTS'05), pp. 439-444, 2005.
  250. N. Ahmed, C.P. Ravikumar, M. Tehranipoor and J. Plusquellic, "At-Speed Transition Fault Testing With Low Speed Scan Enable," in proc. IEEE VLSI Test Symposium (VTS'05), pp. 42-47, 2005.Received Best Paper Award
  251. M. H. Tehranipour, M. Nourani and K. Chakrabarty, "Nine-Coded Compression Technique with Application to Reduced Pin-Count Testing and Flexible On-Chip Decompression," in proc. IEEE/ACM Design, Automation and Test in Europe (DATE'04), Paris, France, vol. 2, pp. 1284-1289, 2004.
  252. M. H. Tehranipour, M. Nourani, K. Arabi and A. Afzali-Kusha, "Mixed RL-Huffman Encoding for Power Reduction and Data Compression in Scan Test," in proc. IEEE International Symposium on Circuits And Systems (ISCAS'04), Vancouver, Canada, vol. 2, pp. 681-684, 2004.
  253. N. Ahmed, M. H. Tehranipour and M. Nourani, "Low-Power Pattern Generation for BIST Architecture," in proc. IEEE International Symposium on Circuits And Systems (ISCAS'04), Vancouver, Canada, vol. 2, pp. 689-692, 2004.
  254. N. Ahmed, M. H. Tehranipour, D. Zhou and M. Nourani,, "Frequency Driven Repeater Insertion for Deep Submicron," in proc. IEEE International Symposium on Circuits And Systems (ISCAS'04), Vancouver, Canada, vol. 5, 181-184, 2004.
  255. M. H. Tehranipour, N. Ahmed and M. Nourani, "Testing SoC Interconnects for Signal Integrity Using Boundary Scan," in proc. IEEE VLSI Test Symposium (VTS'03), Napa, CA, pp. 158-163,  2003.
  256. N. Ahmed, M. H. Tehranipour and M. Nourani, "Extending JTAG for Testing Signal Integrity in SoCs," in proc. IEEE/ACM Design, Automation and Test in Europe (DATE'03), Messe Munich, Germany, pp. 218-223, 2003.
  257. M. H. Tehranipour, N. Ahmed and M. Nourani, "Multiple Transition Model and Enhanced Boundary Scan Architecure to Test Interconnects for Signal Integrity," in proc. IEEE International Conference on Computer Design (ICCD'03), San-Jose, pp. 554-559, CA, 2003.
  258. M. H. Tehranipour, M. Nourani and S. M. Fakhraie, "Systematic Test Program Generation for SoC Testing Using Embedded Processor," in proc. IEEE International Symposium on Circuits And Systems (ISCAS'03), Bangkok, Thailand, vol. 5, pp. 541-544, 2003.
  259. G. R. Chaji, R. M. Pourrrad, S. M. Fakhraie and M. H. Tehranipour, "eUTDSP: A Design Study of a New VLIW-Based DSP Architecture," in proc. IEEE International Symposium on Circuits And Systems (ISCAS'03), Bangkok, Thailand, vol. 4, pp. 137-140, 2003.
  260. M. H. Tehranipour and M. Nourani, "Signal Integrity Loss in SoC's Interconnects: A Diagnostic Approach Using Embedded Microprocessor," in proc. IEEE International Test Conference (ITC'02), Baltimore, MD, pp.1093-1102, 2002.  
  261. S. M. Fakhraie, M. H. Tehranipour, M. R. Movahedin and M. Nourani, "Fast Prototyping of a DSP Core," in proc. IEEE MidWest Symposium on Circuits and Systems (MWSCAS'02), Tulsa, Oklahoma, vol. 2, pp. 215-218, 2002.
  262. M. H. Tehranipour, M. Nourani, S. M. Fakhraie and C. A. Papachristou, "Test Optimization of Bus-Structured SoCs Using Embedded Microprocessor," in proc. IEEE MidWest Symposium on Circuits and Systems (MWSCAS'02), Tulsa, Oklahoma, vol. 1, pp. 168-171, 2002.
  263. M. H. Tehranipour, Z. Navabi and S. M. Fakhraie, "An Efficient BIST for Embedded SRAM Testing," in proc. IEEE International Symposium on Circuits And Systems (ISCAS'01), Sydney, Australia, Vol 5, pp. 73-76, 2001.
  264. M. H. Tehranipour, Z. Navabi and S. M. Fakhraie, "A Low-Cost BIST Architecture for Processor Cores," in proc. IEEE Electronic Circuits and Systems Conference (ECS'01), Bratislava, Slovakia,  pp. 11-14, 2001.
  265. M. H. Tehranipour and Z. Navabi, "Zero-Overhead BIST for Internal SRAM Testing," in proc. IEEE International Conference on Microelectronics (ICM'00), Tehran, Iran, pp. 109-112, 2000.

Technical Reports and Invited Poster Presentations

  1. U. Guin, M. Tehranipoor, D. DiMase, and M. Megrdician, "Counterfeit IC Detection and Challenges Ahead," ACM SIGDA, March 2013.
  2. N. Reddy and M. Tehranioor, "Reliability Analysis for 90nm Test Chips," Technical Reports, CADT-20110110, 2011.
  3. F. Wu1, L. Dilillo, A. Bosio, P. Girard, S. Pravossoudovitch, A. Virazel, M. Tehranipoor, K. Miyase, X. Wen, N. Ahmed, "Is Test Power Reduction Through X-Filling Good Enough?," Poster presentation, Int. Test Conference (ITC), 2010.
  4. J. Lee and M. Tehranipoor, "Low-power Transition Delay Fault Test Pattern Generation," IEEE VLSI Test Symposium (VTS), 2008, PhD Thesis Poster Presentation.
  5. M. Tehranipoor, "Trojan Detection and Isolation in Integrated Circuits," NSF Cyber Trust meeting, New Haven, March 2008
  6.  N. Ahmed, M. Tehranipoor, and V. Jayaram, "Considering IR-Drop Effects During Faster-than-at-Speed Delay Test," presented in Special Session (Elevator Talk), IEEE VLSI Test Symposium (VTS), 2006.
  7. N. Ahmed and M. Tehranipoor, "On-chip Scan Enable Generation for Transition Fault Testing," Poster Presentation, University  Booth, ITC 2005.
  8. J. Plusquellic, D. Acharyya, C. Patel, A. Singh and M. Tehranipoor, "Hardware Investigation of Defect Sensitivity of a Multiple  Supply Pad IDDQ Method," Poster Presentation, University Booth, ITC 2005.
  9. N. Ahmed and M. Tehranipoor, "Enhanced Launch-off-Capture with Improved Fault Coverage and Reduced Pattern Count," Presented in UT-Austin Poster Session, ITC 2005.
  10. M. H. Tehranipour and M. Nourani, "Low-Power Test pattern generation for BIST Architecture," University of Texas at Dallas, 2003.
  11. M. H. Tehranipour and M. Nourani, "Test Compression and Power Reduction in Scan Using RL-Huffman Encoding," University of Texas at Dallas, 2002.